Soft X-ray spectromicroscopy using ptychography with randomly phased illumination

Nature Communications

Volumn 4, Issue , 2013, Pages

  Maiden, A M ^a,d   Morrison, G R ^b,e,f   Kaulich, B ^c,g   Gianoncelli, A ^c   Rodenburg, J M ^a  

^a UNIVERSITY OF SHEFFIELD   (United Kingdom)

^b KING'S COLLEGE LONDON   (United Kingdom)

^c SINCROTRONE TRIESTE   (Italy)

^d Electric Works   (United Kingdom)

^e UNIVERSITY COLLEGE LONDON   (United Kingdom)

^f RUTHERFORD APPLETON LABORATORY   (United Kingdom)

^g DIAMOND LIGHT SOURCE LTD   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

IRON;

CHEMICAL ANALYSIS; EXPERIMENTAL STUDY; IMAGE ANALYSIS; OPTICAL METHOD; SAMPLING; SENSITIVITY ANALYSIS; SIGNAL; X-RAY DIFFRACTION;

ABSORPTION; ARTICLE; CHEMICAL SENSITIVITY; IMAGE ANALYSIS; IMAGE RECONSTRUCTION; IMAGING SYSTEM; MICROSCOPY; MOLECULAR PROBE; PTYCHOGRAPHY; RELIABILITY; SENSITIVITY ANALYSIS; SOFT X RAY SPECTROMICROSCOPY;

EID: 84877738586     PISSN: None     EISSN: 20411723     Source Type: Journal    
DOI: 10.1038/ncomms2640     Document Type: Article

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