Cryo-scanning x-ray diffraction microscopy of frozen-hydrated yeast

Journal of Microscopy

Volumn 249, Issue 1, 2013, Pages 1-7

  Lima, E ^a   Diaz, A ^b   Guizar Sicairos, M ^b   Gorelick, S ^b   Pernot, P ^c   Schleier, T ^b   Menzel, A ^b  

^a BROOKHAVEN NATIONAL LABORATORY   (United States)

^b PAUL SCHERRER INSTITUTE   (Switzerland)

^c EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

Author keywords

Coherent x ray diffraction; Frozen hydrated imaging; Ptychography; Scanning x ray diffraction microscopy

Indexed keywords

CRYOGENICS; HYDRATION; IMAGE RECONSTRUCTION; SYNCHROTRON RADIATION; X RAY DIFFRACTION; YEAST;

COHERENT X-RAY DIFFRACTION; CRYO-SCANNING; CRYOGENIC TEMPERATURES; FROZEN-HYDRATED IMAGING; HARD X RAY; HARD X RAYS; HIGH-RESOLUTION IMAGING; PTYCHOGRAPHY; SCANNING X-RAY DIFFRACTION MICROSCOPY; X-RAY DIFFRACTION MICROSCOPY;

RADIATION DAMAGE;

ARTICLE; CRYOSCANNING X RAY DIFFRACTION MICROSCOPY; FEASIBILITY STUDY; MICROSCOPY; NONHUMAN; PRIORITY JOURNAL; TEMPERATURE; X RAY DIFFRACTION; YEAST; YEAST CELL;

EID: 84870908965     PISSN: 00222720     EISSN: 13652818     Source Type: Journal    
DOI: 10.1111/j.1365-2818.2012.03682.x     Document Type: Article

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