High-resolution and high-sensitivity phase-contrast imaging by focused hard x-ray ptychography with a spatial filter

Applied Physics Letters

Volumn 102, Issue 9, 2013, Pages 5486-

  Takahashi, Yukio ^a   Suzuki, Akihiro ^a   Furutaku, Shin ^a   Yamauchi, Kazuto ^a   Kohmura, Yoshiki ^b   Ishikawa, Tetsuya ^b  

^a OSAKA UNIVERSITY   (Japan)

^b RIKEN SPring 8 Center ^*  (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 85024814485     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4794063     Document Type: Article

References (20)

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