Structural properties of zinc oxide thin films deposited on various substrates

Sains Malaysiana

Volumn 43, Issue 6, 2014, Pages 923-927

  Ching, C G ^a   Ooi, P K ^a   Ng, S S ^a   Hassan, Z ^a   Abu Hassan, H ^a   Abdullah, M J ^a  

^a SCHOOL OF PHYSICS   (Malaysia)

Author keywords

Gallium arsenide; Sapphire; Silicon; Xrd; Zinc oxide

Indexed keywords

ARSENIDE GROUP; FILM; GALLIUM; OXIDE; SAPPHIRE; SILICON; SUBSTRATE; X-RAY DIFFRACTION; ZINC;

EID: 84902456514     PISSN: 01266039     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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