Dependence of the optical anisotropy of ZnO thin films on the structural properties

Journal of the Korean Physical Society

Volumn 57, Issue 21, 2010, Pages 389-394

  Kang, Man Il ^a   Kim, Sok Won ^a   Kim, Yong Gi ^b   Ji Wook, Ji Wook ^b  

^a University of Ulsan   (South Korea)

^b Kongju National University   (South Korea)

Author keywords

Optical anisotropy; Spectroscopic ellipsometry; ZnO

Indexed keywords

EID: 77956312694     PISSN: 03744884     EISSN: None     Source Type: Journal    
DOI: 10.3938/jkps.57.389     Document Type: Article

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