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Volumn 311, Issue 22, 2009, Pages 4641-4646
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Microstructural characteristics and crystallographic evolutions of Ga-doped ZnO films grown on sapphire substrates at high temperatures by RF magnetron sputtering
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Author keywords
A1. Crystal morphology; A1. Doping; A1. Stresses; A3. Physical vapor deposition processes; B1. Zinc compounds
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Indexed keywords
A1. CRYSTAL MORPHOLOGY;
A1. DOPING;
A1. STRESSES;
A3. PHYSICAL VAPOR DEPOSITION PROCESSES;
B1. ZINC COMPOUNDS;
CORUNDUM;
DOPING (ADDITIVES);
EPITAXIAL FILMS;
EPITAXIAL GROWTH;
GALLIUM;
GALLIUM ALLOYS;
GRAIN BOUNDARIES;
HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY;
MAGNETIC FILMS;
MAGNETRON SPUTTERING;
MAGNETRONS;
MORPHOLOGY;
PHYSICAL VAPOR DEPOSITION;
SEMICONDUCTING ZINC COMPOUNDS;
SUBSTRATES;
SULFUR COMPOUNDS;
SURFACE RELAXATION;
TRANSITION METAL COMPOUNDS;
VAPORS;
X RAY DIFFRACTION;
X RAY DIFFRACTION ANALYSIS;
ZINC;
ZINC OXIDE;
FILM GROWTH;
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EID: 70350115971
PISSN: 00220248
EISSN: None
Source Type: Journal
DOI: 10.1016/j.jcrysgro.2009.09.005 Document Type: Article |
Times cited : (10)
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References (16)
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