SCOPUS 정보 검색 플랫폼

Materials Science in Semiconductor Processing

Volumn 26, Issue 1, 2014, Pages 561-566

Effects of annealing on the structural and optical properties of zinc sulfide thin films deposited by ion beam sputtering

(7) Kennedy, J a,b Murmu, P P a Gupta, P S a,c Carder, D A b,d Chong, S V b,e Leveneur, J a Rubanov, S f

a GNS SCIENCE (New Zealand)

b MACDIARMID INSTITUTE FOR ADVANCED MATERIALS AND NANOTECHNOLOGY (New Zealand)

c SRM INSTITUTE OF SCIENCE AND TECHNOLOGY (India)

d CALLAGHAN INNOVATION (New Zealand)

e VICTORIA UNIVERSITY OF WELLINGTON (New Zealand)

f UNIVERSITY OF MELBOURNE (Australia)

Author keywords

Ion beam sputtering; RBS; TEM; UV visible spectroscopy; ZnS

Indexed keywords

ENERGY GAP; OPTICAL PROPERTIES; OPTOELECTRONIC DEVICES; POINT DEFECTS; SPUTTERING; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY; ULTRAVIOLET VISIBLE SPECTROSCOPY; X RAY DIFFRACTION; ZINC;

ION BEAM SPUTTERING DEPOSITION; ION-BEAM SPUTTERING; OPTO-ELECTRONIC MATERIALS; RBS; STRUCTURAL AND OPTICAL PROPERTIES; UV VISIBLE SPECTROSCOPY; ZINC SULFIDE THIN FILMS; ZNS;

ZINC SULFIDE; TRANSMISSION ELECTRON MICROSCOPY;

EID: 84902176430 PISSN: 13698001 EISSN: None Source Type: Journal
DOI: 10.1016/j.mssp.2014.05.055 Document Type: Article

Times cited : (78)

References (35)

1
- 80052060875
- X. Fang, T. Zhai, U.K. Gautam, L. Li, L. Wu, Y. Bando, and G. Golberg Prog. Mater. Sci. 56 2011 175 287
- (2011) Prog. Mater. Sci. , vol.56 , pp. 175-287
- Fang, X.¹ Zhai, T.² Gautam, U.K.³ Li, L.⁴ Wu, L.⁵ Bando, Y.⁶ Golberg, G.⁷

2
- 77954210935
- C. Klingshirn, J. Fallert, H. Zhou, J. Sartor, C. Thiele, F. Maier-Flaig, D. Schneider, and H. Kalt Phys. Status Solidi B 247 2010 1424 1447
- (2010) Phys. Status Solidi B , vol.247 , pp. 1424-1447
- Klingshirn, C.¹ Fallert, J.² Zhou, H.³ Sartor, J.⁴ Thiele, C.⁵ Maier-Flaig, F.⁶ Schneider, D.⁷ Kalt, H.⁸

3
- 84891883477
- J. Kennedy, G.V.M. Williams, P.P. Murmu, and B.J. Ruck Phys. Rev. B 88 2013 214423
- (2013) Phys. Rev. B , vol.88 , pp. 214423
- Kennedy, J.¹ Williams, G.V.M.² Murmu, P.P.³ Ruck, B.J.⁴

4
- 0030169856
- L.D. DeLoach, R.H. Page, G.D. Wilke, S.A. Payne, and W.F. Krupke IEEE J. Quantum Electron. 32 1996 885 895
- (1996) IEEE J. Quantum Electron. , vol.32 , pp. 885-895
- Deloach, L.D.¹ Page, R.H.² Wilke, G.D.³ Payne, S.A.⁴ Krupke, W.F.⁵

5
- 34250781701
- S.B. Mirov, V.V. Fedorov, I.S. Moskalev, and D.V. Martyshkin IEEE J. Quantum Electron. 13 2007 810 822
- (2007) IEEE J. Quantum Electron. , vol.13 , pp. 810-822
- Mirov, S.B.¹ Fedorov, V.V.² Moskalev, I.S.³ Martyshkin, D.V.⁴

6
- 16444367981
- S.B. Qadri, E.F. Skelton, D. Hsu, A.D. Dinsmore, J. Yang, H.F. Gray, and B.R. Ratna Phys. Rev. B 60 1999 9191
- (1999) Phys. Rev. B , vol.60 , pp. 9191
- Qadri, S.B.¹ Skelton, E.F.² Hsu, D.³ Dinsmore, A.D.⁴ Yang, J.⁵ Gray, H.F.⁶ Ratna, B.R.⁷

7
- 84867437733
- A.K. Kole, and P. Kumbhakar Results Phys. 2 2012 150 155
- (2012) Results Phys. , vol.2 , pp. 150-155
- Kole, A.K.¹ Kumbhakar, P.²

8
- 77956613524
- S.P. Patel, J.C. Pavin, V.V. Sivakumar, A. Tripathi, D. Kanjilal, and L. Kumar Vacuum 85 2010 307 311
- (2010) Vacuum , vol.85 , pp. 307-311
- Patel, S.P.¹ Pavin, J.C.² Sivakumar, V.V.³ Tripathi, A.⁴ Kanjilal, D.⁵ Kumar, L.⁶

9
- 77953286702
- S.P. Patel, A.K. Chawla, R. Chandra, J. Prakash, P.K. Kulriya, J.C. Pivin, D. Kanjilal, and L. Kumar Solid State Commun. 150 2010 1158 1161
- (2010) Solid State Commun. , vol.150 , pp. 1158-1161
- Patel, S.P.¹ Chawla, A.K.² Chandra, R.³ Prakash, J.⁴ Kulriya, P.K.⁵ Pivin, J.C.⁶ Kanjilal, D.⁷ Kumar, L.⁸

10
- 84882284618
- W. Zhang, X. Zeng, J. Lu, and H. Chen Mater. Res. Bull. 40 2013 3843 3846
- (2013) Mater. Res. Bull. , vol.40 , pp. 3843-3846
- Zhang, W.¹ Zeng, X.² Lu, J.³ Chen, H.⁴

11
- 84856038480
- D.H. Hwang, J.H. Ahn, K.N. Hui, K.S. Hui, and Y.G. Son Nanoscale Res. Lett. 7 2012 26
- (2012) Nanoscale Res. Lett. , vol.7 , pp. 26
- Hwang, D.H.¹ Ahn, J.H.² Hui, K.N.³ Hui, K.S.⁴ Son, Y.G.⁵

12
- 33748969506
- S. Wang, X. Fu, G. Xi, J. Wang, J. Shao, and Z. Fan Appl. Surf. Sci. 252 2006 8734 8737
- (2006) Appl. Surf. Sci. , vol.252 , pp. 8734-8737
- Wang, S.¹ Fu, X.² Xi, G.³ Wang, J.⁴ Shao, J.⁵ Fan, Z.⁶

13
- 0035254083
- B. Elidrissi, M. Addou, and M. Regragui Mater. Chem. Phys. 68 2001 175 179
- (2001) Mater. Chem. Phys. , vol.68 , pp. 175-179
- Elidrissi, B.¹ Addou, M.² Regragui, M.³

14
- 38049061557
- S. Biswas, and S. Kar Nanotechnology 19 2008 045710
- (2008) Nanotechnology , vol.19 , pp. 045710
- Biswas, S.¹ Kar, S.²

15
- 0023385084
- T.E. Varitimos, and R.W. Tustison Thin Solid Films 151 1987 27 33
- (1987) Thin Solid Films , vol.151 , pp. 27-33
- Varitimos, T.E.¹ Tustison, R.W.²

16
- 38749102413
- J. Kennedy, B. Sundrakannan, R.S. Katiyar, A. Markwitz, Z. Li, and W. Gao Curr. Appl. Phys. 8 2008 291 294
- (2008) Curr. Appl. Phys. , vol.8 , pp. 291-294
- Kennedy, J.¹ Sundrakannan, B.² Katiyar, R.S.³ Markwitz, A.⁴ Li, Z.⁵ Gao, W.⁶

17
- 84855485664
- P.P. Murmu, J. Kennedy, B.J. Ruck, G.V.M. Williams, A. Markwitz, S. Rubanov, and A.A. Suvorova J. Mater. Sci. 47 2012 1119 1126
- (2012) J. Mater. Sci. , vol.47 , pp. 1119-1126
- Murmu, P.P.¹ Kennedy, J.² Ruck, B.J.³ Williams, G.V.M.⁴ Markwitz, A.⁵ Rubanov, S.⁶ Suvorova, A.A.⁷

18
- 34249094922
- J. Kennedy, A. Markwitz, B.J. Ruck, S.M. Durbin, and W. Gao J. Electron. Mater. 36 2007 472 482
- (2007) J. Electron. Mater. , vol.36 , pp. 472-482
- Kennedy, J.¹ Markwitz, A.² Ruck, B.J.³ Durbin, S.M.⁴ Gao, W.⁵

19
- 0003855426
- Springer New York
- C. Suryanarayana, and M. Grant Norton X-ray Diffraction: A Practical Approach 1998 Springer New York
- (1998) X-ray Diffraction: A Practical Approach
- Suryanarayana, C.¹ Norton, M.G.²

20
- 33751433447
- Y.P. Venkata Subbaiah, P. Prathap, and K.T. Ramakrishna Reddy Appl. Surf. Sci. 253 2006 2409 2415
- (2006) Appl. Surf. Sci. , vol.253 , pp. 2409-2415
- Subbaiah, Y.P.V.¹ Prathap, P.² Reddy, K.T.R.³

21
- 0036642617
- W. Water, and S.Y. Chu Mater. Lett. 55 2002 67 72
- (2002) Mater. Lett. , vol.55 , pp. 67-72
- Water, W.¹ Chu, S.Y.²

22
- 0032156888
- I. Sieber, N. Wanderka, I. Urban, I. Dörfel, E. Schierhorn, F. Fenske, and W. Fuhs Thin Solid Films 330 1998 108 113
- (1998) Thin Solid Films , vol.330 , pp. 108-113
- Sieber, I.¹ Wanderka, N.² Urban, I.³ Dörfel, I.⁴ Schierhorn, E.⁵ Fenske, F.⁶ Fuhs, W.⁷

23
- 84985574466
- J. Tauc, R. Grigorovici, and A. Vancu Phys. Status Solidi B 15 1966 627 637
- (1966) Phys. Status Solidi B , vol.15 , pp. 627-637
- Tauc, J.¹ Grigorovici, R.² Vancu, A.³

24
- 27144467728
- M.C. Lopez, J.P. Espinos, F. Martin, D. Leinen, and J.R. Ramos-Barrado J. Cryst. Growth 285 2005 66 75
- (2005) J. Cryst. Growth , vol.285 , pp. 66-75
- Lopez, M.C.¹ Espinos, J.P.² Martin, F.³ Leinen, D.⁴ Ramos-Barrado, J.R.⁵

25
- 0025455652
- T. Maruyama, and T. Kawaguchi Thin Solid Films 188 1990 323 327
- (1990) Thin Solid Films , vol.188 , pp. 323-327
- Maruyama, T.¹ Kawaguchi, T.²

26
- 84872381537
- F.A. La Porta, M.M. Ferrer, Y.V.B. de Santana, C.W. Raubach, V.M. Longo, J.R. Sambrano, E. Longo, J. Andrés, M.S. Li, and J.A. Varela J. Alloys Compd. 556 2013 153 159
- (2013) J. Alloys Compd. , vol.556 , pp. 153-159
- La Porta, F.A.¹ Ferrer, M.M.² De Santana, Y.V.B.³ Raubach, C.W.⁴ Longo, V.M.⁵ Sambrano, J.R.⁶ Longo, E.⁷ Andrés, J.⁸ Li, M.S.⁹ Varela, J.A.¹⁰

27
- 0034111911
- B. Su, and K.L. Choy J. Mater. Chem. 10 2000 949 952
- (2000) J. Mater. Chem. , vol.10 , pp. 949-952
- Su, B.¹ Choy, K.L.²

28
- 84891820258
- F.L. Faita, K. Ersching, C.M. Poffo, L.C. Benetti, D.M. Trichês, S.M. Souza, A.D.C. Viegas, and J.C. de Lima J. Alloys Compd. 590 2014 176 183
- (2014) J. Alloys Compd. , vol.590 , pp. 176-183
- Faita, F.L.¹ Ersching, K.² Poffo, C.M.³ Benetti, L.C.⁴ Trichês, D.M.⁵ Souza, S.M.⁶ Viegas, A.D.C.⁷ De Lima, J.C.⁸

29
- 0038581754
- X. Huang, J. Li, Y. Zhang, and A. Mascarenhas J. Am. Chem. Soc. 125 2003 7049 7055
- (2003) J. Am. Chem. Soc. , vol.125 , pp. 7049-7055
- Huang, X.¹ Li, J.² Zhang, Y.³ Mascarenhas, A.⁴

30
- 0038241614
- Le-Xi Shao, Kuen-Huei Chang, and Huey-Liang Hwang Appl. Surf. Sci. 212-213 2003 305 310
- (2003) Appl. Surf. Sci. , vol.212-213 , pp. 305-310
- Shao, L.-X.¹ Chang, K.-H.² Hwang, H.-L.³

31
- 18644367506
- K.M. Yeung, W.S. Tsang, C.L. Mak, and K.H. Wong J. Appl. Phys. 92 2002 3636
- (2002) J. Appl. Phys. , vol.92 , pp. 3636
- Yeung, K.M.¹ Tsang, W.S.² Mak, C.L.³ Wong, K.H.⁴

32
- 0041511976
- D.G. Zhao, S.J. Xu, M.H. Xie, S.Y. Tong, and H. Yang Appl. Phys. Lett. 83 2003 677
- (2003) Appl. Phys. Lett. , vol.83 , pp. 677
- Zhao, D.G.¹ Xu, S.J.² Xie, M.H.³ Tong, S.Y.⁴ Yang, H.⁵

33
- 43049139193
- P. Prathap, N. Revathi, Y.P. Venkata Subbaiah, and K.T. Ramakrishna Reddy J. Phys.: Condens. Matter 20 2008 035205
- (2008) J. Phys.: Condens. Matter , vol.20 , pp. 035205
- Prathap, P.¹ Revathi, N.² Venkata Subbaiah, Y.P.³ Ramakrishna Reddy, K.T.⁴

34
- 0035362934
- P. Tyagi, and A.G. Vedeshwar Bull. Mater. Sci. 24 2001 297 300
- (2001) Bull. Mater. Sci. , vol.24 , pp. 297-300
- Tyagi, P.¹ Vedeshwar, A.G.²

35
- 80053954639
- P.P. Murmu, J.V. Kennedy, B.J. Ruck, and A. Markwitz Mater. Sci. Forum 700 2012 49 52
- (2012) Mater. Sci. Forum , vol.700 , pp. 49-52
- Murmu, P.P.¹ Kennedy, J.V.² Ruck, B.J.³ Markwitz, A.⁴

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.