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Vacuum

Volumn 85, Issue 2, 2010, Pages 307-311

Grain growth and structural transformation in ZnS nanocrystalline thin films

(6) Patel, Shiv P a Pivin, J C b Siva Kumar, V V c Tripathi, A c Kanjilal, D c Kumar, Lokendra a

a UNIVERSITY OF ALLAHABAD (India)

b CENTRE DE CALCUL DE L INSTITUT NATIONAL DE PHYSIQUE NUCLEAIRE ET DE PHYSIQUE DES PARTICULES (France)

c INTER UNIVERSITY ACCELERATOR CENTRE (India)

Author keywords

Atomic force microscopy; Bandgap; Structural transformation; Surface roughness; Thin films; X ray diffraction

Indexed keywords

BAND GAPS; DIFFERENT SUBSTRATES; GRAIN SIZE; HEXAGONAL WURTZITE; NANOCRYSTALLINE THIN FILMS; RF MAGNETRON SPUTTERING METHOD; STRUCTURAL TRANSFORMATION; ULTRA-VIOLET; ZINC-BLENDE; ZNS THIN FILMS;

ATOMIC FORCE MICROSCOPY; DIFFRACTION; ENERGY GAP; GRAIN GROWTH; GRAIN SIZE AND SHAPE; MAGNETRON SPUTTERING; METAL ANALYSIS; STOICHIOMETRY; SURFACE PROPERTIES; THIN FILMS; VAPOR DEPOSITION; X RAY DIFFRACTION; ZINC; ZINC SULFIDE;

SURFACE ROUGHNESS;

EID: 77956613524 PISSN: 0042207X EISSN: None Source Type: Journal
DOI: 10.1016/j.vacuum.2010.06.011 Document Type: Article

Times cited : (35)

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