Raman scattering investigation of hydrogen and nitrogen ion implanted ZnO thin films

Current Applied Physics

Volumn 8, Issue 3-4, 2008, Pages 291-294

  Kennedy, J ^a   Sundrakannan, B ^b   Katiyar, R S ^b   Markwitz, A ^a   Li, Z ^c   Gao, W ^c  

^a GNS SCIENCE   (New Zealand)

^b UNIVERSITY OF PUERTO RICO   (Puerto Rico)

^c UNIVERSITY OF AUCKLAND   (New Zealand)

Author keywords

Ion implantation; Raman scattering; ZnO thin films

Indexed keywords

ION IMPLANTATION; RAMAN SCATTERING; THIN FILMS; VIBRATION ANALYSIS;

CHARACTERISTIC VIBRATIONS; DISORDERED PHASES; ION BEAM ANALYSIS MEASUREMENTS; STRUCTURAL DISORDER;

ZINC OXIDE;

EID: 38749102413     PISSN: 15671739     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.cap.2007.10.018     Document Type: Article

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