SCOPUS 정보 검색 플랫폼

Journal of Materials Science

Volumn 47, Issue 3, 2012, Pages 1119-1126

Effect of annealing on the structural, electrical and magnetic properties of Gd-implanted ZnO thin films

(7) Murmu, P P a,b,c Kennedy, J a,c Ruck, B J b,c Williams, G V M c,d Markwitz, A a,c Rubanov, S e Suvorova, A A f

a GNS SCIENCE (New Zealand)

b VICTORIA UNIVERSITY OF WELLINGTON (New Zealand)

c MACDIARMID INSTITUTE FOR ADVANCED MATERIALS AND NANOTECHNOLOGY (New Zealand)

d CALLAGHAN INNOVATION (New Zealand)

e UNIVERSITY OF MELBOURNE (Australia)

f UNIVERSITY OF WESTERN AUSTRALIA (Australia)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALED FILMS; AVERAGE GRAIN SIZE; ELECTRICAL AND MAGNETIC PROPERTY; ENERGY FILTERED TRANSMISSION ELECTRON MICROSCOPY; FERROMAGNETIC BEHAVIOUR; FLUENCES; HIGH RESOLUTION; MAGNETIC PHASIS; NEAR SURFACE REGIONS; ORDERS OF MAGNITUDE; SEM IMAGE; SPATIALLY INHOMOGENEOUS; SUPERPARAMAGNETICS; X-RAY ABSORPTION NEAR EDGE SPECTROSCOPY; ZNO; ZNO FILMS; ZNO THIN FILM;

ANNEALING; ATOMIC SPECTROSCOPY; CARRIER CONCENTRATION; ELECTRIC PROPERTIES; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; MAGNETIC PROPERTIES; METALLIC FILMS; OXIDE FILMS; OXYGEN VACANCIES; PARAMAGNETIC MATERIALS; SUPERPARAMAGNETISM; TRANSMISSION ELECTRON MICROSCOPY; ZINC OXIDE;

GADOLINIUM;

EID: 84855485664 PISSN: 00222461 EISSN: 15734803 Source Type: Journal
DOI: 10.1007/s10853-011-5883-z Document Type: Article

Times cited : (75)

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