Optical studies of ZnS:Mn films grown by pulsed laser deposition

Journal of Applied Physics

Volumn 92, Issue 7, 2002, Pages 3636-3640

  Yeung, K M ^a   Tsang, W S ^a   Mak, C L ^a   Wong, K H ^a  

^a HONG KONG POLYTECHNIC UNIVERSITY   (Hong Kong)

Author keywords

[No Author keywords available]

Indexed keywords

ABSORPTION EDGES; ABSORPTION MEASUREMENTS; DOUBLE LAYERS; EMISSION BANDS; HIGH QUALITY; MODEL CALCULATIONS; OPTICAL STUDY; PHOTOLUMINESCENCE MEASUREMENTS; SELLMEIER MODEL; SHORTER WAVELENGTH; SI SUBSTRATES; STRUCTURAL QUALITIES; SUBSTRATE TEMPERATURE; SURFACE LAYERS; TWO LAYERS;

GROWTH TEMPERATURE; PULSED LASER DEPOSITION; REFRACTIVE INDEX; SPECTROSCOPIC ELLIPSOMETRY; SUBSTRATES; X RAY DIFFRACTION; ZINC SULFIDE;

MANGANESE;

EID: 18644367506     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1503389     Document Type: Article

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