Thermal annealing-induced formation of ZnO nanoparticles: Minimum strain and stress ameliorate preferred c-axis orientation and crystal-growth properties

Journal of Alloys and Compounds

Volumn 610, Issue , 2014, Pages 575-588

  Malek, M F ^a   Mamat, M H ^a   Musa, M Z ^a   Khusaimi, Z ^a   Sahdan, M Z ^b   Suriani, A B ^c   Ishak, A ^a   Saurdi, I ^a   Rahman, S A ^d   Rusop, M ^a  

^a UNIVERSITI TEKNOLOGI MARA   (Malaysia)

^b UNIVERSITI TUN HUSSEIN ONN MALAYSIA   (Malaysia)

^c SULTAN IDRIS EDUCATION UNIVERSITY   (Malaysia)

^d UNIVERSITY OF MALAYA   (Malaysia)

Author keywords

Sol gel processes; Strain; Stress; Thin films; X ray diffraction; ZnO

Indexed keywords

ATMOSPHERIC TEMPERATURE; COATINGS; COMPRESSIVE STRESS; ELECTRIC PROPERTIES; METALLIC FILMS; OPTICAL BAND GAPS; OPTICAL FILMS; PIEZOELECTRICITY; SOL-GEL PROCESS; STRAIN; STRESSES; SUBSTRATES; THIN FILMS; X RAY DIFFRACTION; ZINC OXIDE;

ABSORPTION CO-EFFICIENT; AS-DEPOSITED FILMS; C-AXIS ORIENTATIONS; PIEZOELECTRIC PROPERTY; RESISTIVITY VALUES; SOL GEL DIP COATING; THICKNESS OF THE FILM; ZNO;

CRYSTAL ORIENTATION;

EID: 84901989652     PISSN: 09258388     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jallcom.2014.05.036     Document Type: Article

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