메뉴 건너뛰기




Volumn 5, Issue , 2014, Pages

Imaging atomic-level random walk of a point defect in graphene

Author keywords

[No Author keywords available]

Indexed keywords

GRAPHENE;

EID: 84901773254     PISSN: None     EISSN: 20411723     Source Type: Journal    
DOI: 10.1038/ncomms4991     Document Type: Article
Times cited : (127)

References (23)
  • 1
    • 4344607594 scopus 로고    scopus 로고
    • Direct evidence for atomic defects in graphene layers
    • DOI 10.1038/nature02817
    • Hashimoto, A., Suenaga, K., Gloter, A., Urita, K. & Iijima, S. Direct evidence for atomic defects in graphene layers. Nature 430, 870-873 (2004). (Pubitemid 39119210)
    • (2004) Nature , vol.430 , Issue.7002 , pp. 870-873
    • Hashimoto, A.1    Suenaga, K.2    Gloter, A.3    Urita, K.4    Iijima, S.5
  • 2
    • 57749090769 scopus 로고    scopus 로고
    • Direct imaging of lattice atoms and topological defects in graphene membranes
    • Meyer, J. C. et al. Direct imaging of lattice atoms and topological defects in graphene membranes. Nano Lett. 8, 3582-3586 (2008).
    • (2008) Nano Lett. , vol.8 , pp. 3582-3586
    • Meyer, J.C.1
  • 3
    • 67650445626 scopus 로고    scopus 로고
    • Fabrication of a freestanding boron nitride single layer and its defect assignments
    • Jin, C., Lin, F., Suenaga, K. & Iijima, S. Fabrication of a freestanding boron nitride single layer and its defect assignments. Phys. Rev. Lett. 102, 195505 (2009).
    • (2009) Phys. Rev. Lett. , vol.102 , pp. 195505
    • Jin, C.1    Lin, F.2    Suenaga, K.3    Iijima, S.4
  • 4
    • 67650361317 scopus 로고    scopus 로고
    • Selective sputtering and atomic resolution imaging of atomically thin boron nitride membranes
    • Meyer, J. C., Chuvilin, A., Algara-Siller, G., Biskupek, J. & Kaiser, U. Selective sputtering and atomic resolution imaging of atomically thin boron nitride membranes. Nano Lett. 9, 2683-2689 (2009).
    • (2009) Nano Lett. , vol.9 , pp. 2683-2689
    • Meyer, J.C.1    Chuvilin, A.2    Algara-Siller, G.3    Biskupek, J.4    Kaiser, U.5
  • 5
    • 84863941695 scopus 로고    scopus 로고
    • Two-dimensional transition metal dichalcogenides under electron irradiation: Defect production and doping
    • Komsa, H.-P. et al. Two-dimensional transition metal dichalcogenides under electron irradiation: defect production and doping. Phys. Rev. Lett. 109, 035503 (2012).
    • (2012) Phys. Rev. Lett. , vol.109 , pp. 035503
    • Komsa, H.-P.1
  • 6
    • 84856962325 scopus 로고    scopus 로고
    • Direct imaging of a two-dimensional silica glass on graphene
    • Huang, P. Y. et al. Direct imaging of a two-dimensional silica glass on graphene. Nano Lett. 12, 1081-1086 (2012).
    • (2012) Nano Lett. , vol.12 , pp. 1081-1086
    • Huang, P.Y.1
  • 7
    • 77950283360 scopus 로고    scopus 로고
    • Atom-by-atom structural and chemical analysis by annular dark-field electron microscopy
    • Krivanek, O. L. et al. Atom-by-atom structural and chemical analysis by annular dark-field electron microscopy. Nature 464, 571-574 (2010).
    • (2010) Nature , vol.464 , pp. 571-574
    • Krivanek, O.L.1
  • 8
    • 79951879904 scopus 로고    scopus 로고
    • Experimental analysis of charge redistribution due to chemical bonding by high-resolution transmission electron microscopy
    • Meyer, J. C. et al. Experimental analysis of charge redistribution due to chemical bonding by high-resolution transmission electron microscopy. Nat. Mater. 10, 209-215 (2011).
    • (2011) Nat. Mater. , vol.10 , pp. 209-215
    • Meyer, J.C.1
  • 9
    • 84869029988 scopus 로고    scopus 로고
    • Direct determination of the chemical bonding of individual impurities in graphene
    • Zhou, W. et al. Direct determination of the chemical bonding of individual impurities in graphene. Phys. Rev. Lett. 109, 206803 (2012).
    • (2012) Phys. Rev. Lett. , vol.109 , pp. 206803
    • Zhou, W.1
  • 10
    • 85014024560 scopus 로고    scopus 로고
    • Probing the bonding and electronic structure of single atom dopants in graphene with electron energy loss spectroscopy
    • Ramasse, Q. M. et al. Probing the bonding and electronic structure of single atom dopants in graphene with electron energy loss spectroscopy. Nano Lett. 13, 4989-4995 (2013).
    • (2013) Nano Lett. , vol.13 , pp. 4989-4995
    • Ramasse, Q.M.1
  • 11
    • 79961241132 scopus 로고    scopus 로고
    • Stone-wales type transformations in carbon nanostructures driven by electron irradiation
    • Kotakoski, J. et al. Stone-wales type transformations in carbon nanostructures driven by electron irradiation. Phys. Rev. B 83, 245420 (2011).
    • (2011) Phys. Rev. B , vol.83 , pp. 245420
    • Kotakoski, J.1
  • 12
    • 84869382912 scopus 로고    scopus 로고
    • Spatial control of defect creation in graphene at the nanoscale
    • Robertson, A. W. et al. Spatial control of defect creation in graphene at the nanoscale. Nat. Commun. 3, 1144 (2012).
    • (2012) Nat. Commun. , vol.3 , pp. 1144
    • Robertson, A.W.1
  • 13
    • 84878304935 scopus 로고    scopus 로고
    • Structural reconstruction of the graphene monovacancy
    • Robertson, A. W. et al. Structural reconstruction of the graphene monovacancy. ACS Nano 7, 4495-4502 (2013).
    • (2013) ACS Nano , vol.7 , pp. 4495-4502
    • Robertson, A.W.1
  • 14
    • 84894121205 scopus 로고    scopus 로고
    • Direct observation of a long-lived single-atom catalyst chiseling atomic structures in graphene
    • Wang, W. L. et al. Direct observation of a long-lived single-atom catalyst chiseling atomic structures in graphene. Nano Lett. 14, 450-455 (2014).
    • (2014) Nano Lett. , vol.14 , pp. 450-455
    • Wang, W.L.1
  • 15
    • 84862301147 scopus 로고    scopus 로고
    • Atom-by-atom observation of grain boundary migration in graphene
    • Kurasch, S. et al. Atom-by-atom observation of grain boundary migration in graphene. Nano Lett. 12, 3168-3173 (2012).
    • (2012) Nano Lett. , vol.12 , pp. 3168-3173
    • Kurasch, S.1
  • 16
    • 84863759630 scopus 로고    scopus 로고
    • Dislocation-driven deformations in graphene
    • Warner, J. H. et al. Dislocation-driven deformations in graphene. Science 337, 209-212 (2012).
    • (2012) Science , vol.337 , pp. 209-212
    • Warner, J.H.1
  • 17
    • 84880900046 scopus 로고    scopus 로고
    • Atomic scale study of the life cycle of a dislocation in graphene from birth to annihilation
    • Lehtinen, O., Kurasch, S., Krasheninnikov, A. V. & Kaiser, U. Atomic scale study of the life cycle of a dislocation in graphene from birth to annihilation. Nat. Commun. 4, 2098 (2013).
    • (2013) Nat. Commun. , vol.4 , pp. 2098
    • Lehtinen, O.1    Kurasch, S.2    Krasheninnikov, A.V.3    Kaiser, U.4
  • 18
    • 84877762843 scopus 로고    scopus 로고
    • Direct visualization of reversible dynamics in a Si6 cluster embedded in a graphene pore
    • Lee, J., Zhou, W., Pennycook, S. J., Idrobo, J.-C. & Pantelides, S. T. Direct visualization of reversible dynamics in a Si6 cluster embedded in a graphene pore. Nat. Commun. 4, 1650 (2013).
    • (2013) Nat. Commun. , vol.4 , pp. 1650
    • Lee, J.1    Zhou, W.2    Pennycook, S.J.3    Idrobo, J.-C.4    Pantelides, S.T.5
  • 19
    • 38349094811 scopus 로고    scopus 로고
    • An electron microscope for the aberration-corrected era
    • Krivanek, O. L. et al. An electron microscope for the aberration-corrected era. Ultramicroscopy 108, 179-195 (2008).
    • (2008) Ultramicroscopy , vol.108 , pp. 179-195
    • Krivanek, O.L.1
  • 21
  • 22
    • 29644445226 scopus 로고    scopus 로고
    • Defect energies of graphite: Density-functional calculations
    • Li, L., Reich, S. & Robertson, J. Defect energies of graphite: density-functional calculations. Phys. Rev. B 72, 184109 (2005).
    • (2005) Phys. Rev. B , vol.72 , pp. 184109
    • Li, L.1    Reich, S.2    Robertson, J.3
  • 23
    • 2342561300 scopus 로고    scopus 로고
    • Radiation damage in the TEM and SEM
    • DOI 10.1016/j.micron.2004.02.003, PII S0968432804000381
    • Egerton, R., Li, P. & Malac, M. Radiation damage in the TEM and SEM. Micron 35, 399-409 (2004). (Pubitemid 38583516)
    • (2004) Micron , vol.35 , Issue.6 , pp. 399-409
    • Egerton, R.F.1    Li, P.2    Malac, M.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.