The effect of probe inaccuracies on the quantitative model-based analysis of high angle annular dark field scanning transmission electron microscopy images

Micron

Volumn 63, Issue , 2014, Pages 57-63

  Martinez, G T ^a   De Backer, A ^a   Rosenauer, A ^b   Verbeeck, J ^a   Van Aert, S ^a  

^a UNIVERSITY OF ANTWERP   (Belgium)

^b UNIVERSITY OF BREMEN   (Germany)

Author keywords

HAADF STEM; Probe aberrations; Statistical parameter estimation theory; STEM simulations

Indexed keywords

CESIUM; PARAMETER ESTIMATION; TRANSMISSION ELECTRON MICROSCOPY; ELECTRON MICROSCOPY; PROBES; SCANNING ELECTRON MICROSCOPY;

CHEMICAL INFORMATION; HAADF-STEM; HIGH-ANGLE ANNULAR DARK FIELDS; MODEL-BASED ANALYSIS; SCATTERED INTENSITY; SPHERICAL ABERRATIONS; STATISTICAL PARAMETER ESTIMATIONS; STEM SIMULATIONS; QUANTITATIVE MODELING;

PROBES; PARAMETER ESTIMATION;

EID: 84901603928     PISSN: 09684328     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.micron.2013.12.009     Document Type: Article

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