Essential experimental parameters for quantitative structure analysis using spherical aberration-corrected HAADF-STEM

Ultramicroscopy

Volumn 110, Issue 5, 2010, Pages 555-562

  Kotaka, Yasutoshi ^a  

^a FUJITSU LABORATORIES LTD   (Japan)

Author keywords

Cs corrected STEM; HAADF STEM; Z contrast

Indexed keywords

ATOMIC COLUMNS; BLOCH WAVES; DEFOCUS; EXPERIMENTAL CONDITIONS; EXPERIMENTAL PARAMETERS; HAADF-STEM; HIGH-ANGLE ANNULAR DARK FIELDS; INTENSITY RATIO; PROBE CURRENTS; QUANTITATIVE ANALYSIS; QUANTITATIVE STRUCTURES; SCANNING TRANSMISSION ELECTRON MICROSCOPES; SPECIMEN THICKNESS; SPHERICAL ABERRATIONS; SRTIO; STEM IMAGES; STEM-HAADF; Z-CONTRAST IMAGES;

SULFUR COMPOUNDS; TRANSMISSION ELECTRON MICROSCOPY;

ABERRATIONS;

STRONTIUM; TITANIUM TETRACHLORIDE;

ACCURACY; ARTICLE; BRIGHTNESS; CONTRAST ENHANCEMENT; HIGH ANGLE ANNULAR DARK FIELD SCANNING TRANSMISSION ELECTRON MICROSCOPY; IMAGE ANALYSIS; IMAGE INTENSIFIER; IMAGING SYSTEM; QUANTITATIVE ANALYSIS; SCANNING TRANSMISSION ELECTRON MICROSCOPY; STRUCTURE ANALYSIS; THICKNESS; VALIDITY;

EID: 77952320666     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ultramic.2009.12.008     Document Type: Article

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