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Volumn 25, Issue 5, 2014, Pages 2297-2304

Effect of doping Al on the liquid oxidation of Sn-Bi-Zn solder

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINA; ALUMINUM METALLOGRAPHY; ALUMINUM OXIDE; BISMUTH ALLOYS; BISMUTH METALLOGRAPHY; FREE ENERGY; GIBBS FREE ENERGY; GRAVIMETRIC ANALYSIS; GROWTH RATE; II-VI SEMICONDUCTORS; LEAD-FREE SOLDERS; OXIDATION; OXIDE MINERALS; SEMICONDUCTOR DOPING; TERNARY ALLOYS; THERMOGRAVIMETRIC ANALYSIS; TIN ALLOYS; TIN METALLOGRAPHY; X RAY PHOTOELECTRON SPECTROSCOPY; ZINC ALLOYS; ZINC OXIDE;

EID: 84899057380     PISSN: 09574522     EISSN: 1573482X     Source Type: Journal    
DOI: 10.1007/s10854-014-1875-5     Document Type: Article
Times cited : (19)

References (35)
  • 1
    • 85103598461 scopus 로고    scopus 로고
    • Thermal interface materials in electronic packaging
    • ed. by K. Itoh, T. Lee, T. Sakurai, W. M. C. Sansen, D. Schimitt-Landsiedel (Springer, New York
    • X.C. Tong, in Thermal Interface Materials in Electronic Packaging, ed. by K. Itoh, T. Lee, T. Sakurai, W. M. C. Sansen, D. Schimitt-Landsiedel. Advanced Materials for Thermal Management of Electronic Packaging, (Springer, New York, 2011), pp. 305-370
    • (2011) Advanced Materials for Thermal Management of Electronic Packaging , pp. 305-370
    • Tong, X.C.1
  • 10
  • 20
    • 0032187661 scopus 로고    scopus 로고
    • 10.1023/A:1018840405283
    • K.L. Lin, T.P. Liu, Oxid. Met. 50, 255-267 (1998)
    • (1998) Oxid. Met. , vol.50 , pp. 255-267
    • Lin, K.L.1    Liu, T.P.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.