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Volumn 25, Issue 15, 2014, Pages

Gate-bias stress-dependent photoconductive characteristics of multi-layer MoS2 field-effect transistors

Author keywords

fieldeffect transistors; molybdenum disulfide; photoresponse

Indexed keywords

DECAY CHARACTERISTICS; ELECTRON-HOLE PAIR GENERATION; FIELD EFFECT TRANSISTOR (FETS); MEASUREMENT CONDITIONS; MOLYBDENUM DISULFIDE; OPTICAL AND ELECTRICAL PROPERTIES; OXYGEN-RELATED DEFECTS; PHOTORESPONSES;

EID: 84897911591     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/25/15/155201     Document Type: Article
Times cited : (55)

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  • 33
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  • 35
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    • (2012) Nano Lett. , vol.12 , pp. 1538
    • Liu, K.K.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.