-
1
-
-
84897444725
-
-
D. Ginley, H. Hosono, and D. Paine, Eds. New York, NY, USA: Springer-Verlag, ch. 13
-
H. Hosono, Handbook of Transparent Conductors, D. Ginley, H. Hosono, and D. Paine, Eds. New York, NY, USA: Springer-Verlag, 2010, ch. 13.
-
(2010)
Handbook of Transparent Conductors
-
-
Hosono, H.1
-
2
-
-
84855965812
-
Review of recent developments in amorphous oxide semiconductor thin-film transistor devices
-
Jan
-
J. S. Park, W.-J. Maeng, H.-S. Kim, and J.-S. Park, "Review of recent developments in amorphous oxide semiconductor thin-film transistor devices," Thin Solid Films, vol. 520, no. 6, pp. 1679-1693, Jan. 2012.
-
(2012)
Thin Solid Films
, vol.520
, Issue.6
, pp. 1679-1693
-
-
Park, J.S.1
Maeng, W.-J.2
Kim, H.-S.3
Park, J.-S.4
-
3
-
-
9744248669
-
Room-temperature fabrication of transparent flexible thin-film transistors using amorphous oxide semiconductors
-
DOI 10.1038/nature03090
-
K. Nomura, H. Ohta, A. Takagi, T. Kamiya, M. Hirano, and H. Hosono, "Room-temperature fabrication of transparent flexible thin-film transistors using amorphous oxide semiconductors," Nature, vol. 432, no. 7016, pp. 488-492, Nov. 2004. (Pubitemid 39585210)
-
(2004)
Nature
, vol.432
, Issue.7016
, pp. 488-492
-
-
Nomura, K.1
Ohta, H.2
Takagi, A.3
Kamiya, T.4
Hirano, M.5
Hosono, H.6
-
4
-
-
5444268548
-
Carrier transport in transparent oxide semiconductor with intrinsic structural randomness probed using single-crystalline ingao3(zno)5 films
-
Sep
-
K. Nomura, T. Kamiya, H. Ohta, K. Ueda, M. Hirano, and H. Hosono, "Carrier transport in transparent oxide semiconductor with intrinsic structural randomness probed using single-crystalline InGaO3(ZnO)5 films," Appl. Phys. Lett., vol. 85, no. 11, pp. 1993-1995, Sep. 2004.
-
(2004)
Appl. Phys. Lett
, vol.85
, Issue.11
, pp. 1993-1995
-
-
Nomura, K.1
Kamiya, T.2
Ohta, H.3
Ueda, K.4
Hirano, M.5
Hosono, H.6
-
5
-
-
79957568495
-
Trap-limited and percolation conduction mechanisms in amorphous oxide semiconductor thin film transistors
-
May
-
S. Lee, K. Ghaffarzadeh, A. Nathan, J. Robertson, S. Jeon, C. Kim, et al., "Trap-limited and percolation conduction mechanisms in amorphous oxide semiconductor thin film transistors," Appl. Phys. Lett., vol. 98, no. 20, pp. 203508-1-203508-3, May 2011.
-
(2011)
Appl. Phys. Lett
, vol.98
, Issue.20
, pp. 2035081-2035083
-
-
Lee, S.1
Ghaffarzadeh, K.2
Nathan, A.3
Robertson, J.4
Jeon, S.5
Kim, C.6
-
6
-
-
55149104462
-
12.1-inch wxga amoled display driven by indium-gallium-zinc oxide tfts array
-
J. Jeong, J. Kyong, C. J. Han, and J. H. Choi, "12.1-inch WXGA AMOLED display driven by indium-gallium-zinc oxide TFTs array," SID Symp. Dig. Tech. Papers, vol. 39, no. 1, pp. 1-4, 2008.
-
(2008)
SID Symp. Dig. Tech. Papers
, vol.39
, Issue.1
, pp. 1-4
-
-
Jeong, J.1
Kyong, J.2
Han, C.J.3
Choi, J.H.4
-
7
-
-
84858676946
-
High-mobility oxide tft for circuit integration of amoleds
-
E. Fukumoto, T. Arai, N. Morosawa, K. Tokunaga, Y. Terai, T. Fujimori, et al., "High-mobility oxide TFT for circuit integration of AMOLEDs," J. SID, vol. 19, no. 12, pp. 867-872, 2011.
-
(2011)
J. SID
, vol.19
, Issue.12
, pp. 867-872
-
-
Fukumoto, E.1
Arai, T.2
Morosawa, N.3
Tokunaga, K.4
Terai, Y.5
Fujimori, T.6
-
8
-
-
84861829395
-
Oxide semiconductor thinfilm transistors: A review of recent advances
-
Jun
-
E. Fortunato, P. Barquinha, and R. Martins, "Oxide semiconductor thinfilm transistors: A review of recent advances," Adv. Mater., vol. 24, no. 22, pp. 2945-2986, Jun. 2012.
-
(2012)
Adv. Mater
, vol.24
, Issue.22
, pp. 2945-2986
-
-
Fortunato, E.1
Barquinha, P.2
Martins, R.3
-
9
-
-
78650292470
-
Low-temperature, high-performance solution-processed metal oxide thin-film transistors formed by a 'sol-gel on chip' process
-
Jan
-
K. K. Banger, Y. Yamashita, K. Mori, R. L. Peterson, T. Leedham, J. Rickard, et al., "Low-temperature, high-performance solution-processed metal oxide thin-film transistors formed by a 'sol-gel on chip' process," Nature Mater., vol. 10, pp. 45-50, Jan. 2011.
-
(2011)
Nature Mater
, vol.10
, pp. 45-50
-
-
Banger, K.K.1
Yamashita, Y.2
Mori, K.3
Peterson, R.L.4
Leedham, T.5
Rickard, J.6
-
10
-
-
79955037663
-
Lowtemperature fabrication of high-performance metal oxide thin-film electronics via combustion processing
-
May
-
M. Kim, M. G. Kanatzidis, A. Facchetti, and T. J. Marks, "Lowtemperature fabrication of high-performance metal oxide thin-film electronics via combustion processing," Nature, vol. 10, pp. 382-388, May 2011.
-
(2011)
Nature
, vol.10
, pp. 382-388
-
-
Kim, M.1
Kanatzidis, M.G.2
Facchetti, A.3
Marks, T.J.4
-
11
-
-
79953685635
-
Low-temperature, highperformance, solution-processed indium oxide thin-film transistors
-
Mar
-
S.-Y. Han, G. S. Herman, and C.-H. Chang, "Low-temperature, highperformance, solution-processed indium oxide thin-film transistors," J. Amer. Chem. Soc., vol. 133, no. 14, pp. 5166-5169, Mar. 2011.
-
(2011)
J. Amer. Chem. Soc
, vol.133
, Issue.14
, pp. 5166-5169
-
-
Han, S.-Y.1
Herman, G.S.2
Chang, C.-H.3
-
12
-
-
84865737334
-
Flexible metal-oxide devices made by room temperature photochemical activation of sol-gel films
-
Sep
-
Y.-H. Kim, J.-S. Heo, T.-H. Kim, S. Park, M.-H. Yoon, J. Kim, et al., "Flexible metal-oxide devices made by room temperature photochemical activation of sol-gel films," Nature, vol. 489, pp. 128-133, Sep. 2012.
-
(2012)
Nature
, vol.489
, pp. 128-133
-
-
Kim, Y.-H.1
Heo, J.-S.2
Kim, T.-H.3
Park, S.4
Yoon, M.-H.5
Kim, J.6
-
13
-
-
52449126655
-
High performance solution-processed indium oxide thin-film transistors
-
Aug
-
H. S. Kim, P. D. Byrne, A. Facchetti, and T. J. Marks, "High performance solution-processed indium oxide thin-film transistors," J. Amer. Chem. Soc., vol. 130, no. 38, pp. 12580-12581, Aug. 2008.
-
(2008)
J. Amer. Chem. Soc
, vol.130
, Issue.38
, pp. 12580-12581
-
-
Kim, H.S.1
Byrne, P.D.2
Facchetti, A.3
Marks, T.J.4
-
14
-
-
77953771294
-
Solution-processed zinc-tin oxide thin-film transistors with low interfacial trap density and improved performance
-
Jun
-
C.-G. Lee and A. Dodabalapur, "Solution-processed zinc-tin oxide thin-film transistors with low interfacial trap density and improved performance," Appl. Phys. Lett., vol. 96, no. 24, pp. 243501-1-243501-3, Jun. 2010.
-
(2010)
Appl. Phys. Lett
, vol.96
, Issue.24
, pp. 2435011-2435013
-
-
Lee, C.-G.1
Dodabalapur, A.2
-
15
-
-
84861321784
-
Improvement of the photo-bias stability of the zn-sn-o field effect transistors by an ozone treatment
-
B. S. Yang, S. Park, Y. J. Kim, J. K. Jeong, C. S. Hwang, and H. J. Kim, "Improvement of the photo-bias stability of the Zn-Sn-O field effect transistors by an ozone treatment," J. Mater. Chem., vol. 22, no. 22, pp. 10994-10998, 2012.
-
(2012)
J. Mater. Chem
, vol.22
, Issue.22
, pp. 10994-10998
-
-
Yang, B.S.1
Park, S.2
Kim, Y.J.3
Jeong, J.K.4
Hwang, C.S.5
Kim, H.J.6
-
16
-
-
0028485724
-
Preparation of transparent, electrically conducting zno film from zinc acetate and alkoxide
-
Y. Ohya, H. Saiki, and Y. Takahashi, "Preparation of transparent, electrically conducting ZnO film from zinc acetate and alkoxide," J. Mater. Sci., vol. 29, no. 15, pp. 4099-4103, 1994.
-
(1994)
J. Mater. Sci
, vol.29
, Issue.15
, pp. 4099-4103
-
-
Ohya, Y.1
Saiki, H.2
Takahashi, Y.3
-
17
-
-
0030125272
-
Preparation of ZnO films with preferential orientation by sol-gel method
-
M. Ohyama, H. Kozuka, and T. Yoko, "Preparation of ZnO films with a preferential orientation by sol-gel method," J. Ceram. Soc. Jpn., vol. 104, no. 4, pp. 296-300, 1996. (Pubitemid 126622449)
-
(1996)
Nippon Seramikkusu Kyokai Gakujutsu Ronbunshi/Journal of the Ceramic Society of Japan
, vol.104
, Issue.4
, pp. 296-300
-
-
Ohyama, M.1
Kozuka, H.2
Yoko, T.3
Sakka, S.4
-
18
-
-
79952516333
-
Operation characteristics of thin-film transistors using very thin amorphous in-ga-zn-o channels
-
Feb
-
L. Shao, K. Nomura, T. Kamiya, and H. Hosono, "Operation characteristics of thin-film transistors using very thin amorphous In-Ga-Zn-O channels," Electrochem. Solid-State Lett., vol. 14, no. 5, pp. H197-H200, Feb. 2011.
-
(2011)
Electrochem. Solid-State Lett
, vol.14
, Issue.5
-
-
Shao, L.1
Nomura, K.2
Kamiya, T.3
Hosono, H.4
-
19
-
-
0142039725
-
In situ infrared spectroscopic studies of ultrathin inorganic film growth on zinc in non-polymerizing cold plasmas
-
Oct
-
N. J. Shirtcliffe, M. Stratmann, and G. Grundmeier, "In situ infrared spectroscopic studies of ultrathin inorganic film growth on zinc in non-polymerizing cold plasmas," Surf. Inter. Anal., vol. 35, no. 10, pp. 799-804, Oct. 2003.
-
(2003)
Surf. Inter. Anal
, vol.35
, Issue.10
, pp. 799-804
-
-
Shirtcliffe, N.J.1
Stratmann, M.2
Grundmeier, G.3
-
20
-
-
0001754523
-
Matrix reactions of molecular oxygen with indium and gallium atoms
-
Mar
-
M. J. Zehe, D. A. Lynch, B. J. Kelsall, and K. D. Carlson, "Matrix reactions of molecular oxygen with indium and gallium atoms," J. Phys. Chem., vol. 83, no. 6, pp. 656-664, Mar. 1979.
-
(1979)
J. Phys. Chem
, vol.83
, Issue.6
, pp. 656-664
-
-
Zehe, M.J.1
Lynch, D.A.2
Kelsall, B.J.3
Carlson, K.D.4
-
21
-
-
33645290508
-
Ab initio calculations of the o1s xps spectra of zno and zn oxo compounds
-
Feb
-
K. Kotsis and V. Staemmler, "Ab initio calculations of the O1s XPS spectra of ZnO and Zn oxo compounds," Phys. Chem. Chem. Phys., vol. 8, no. 13, pp. 1490-1498, Feb. 2006.
-
(2006)
Phys. Chem. Chem. Phys
, vol.8
, Issue.13
, pp. 1490-1498
-
-
Kotsis, K.1
Staemmler, V.2
-
22
-
-
77649122278
-
Origins of high mobility and low operation voltage of amorphous oxide tfts: Electronic structure, electron transport, defects and doping
-
Dec
-
T. Kamiya, K. Nomura, and H. Hosono, "Origins of high mobility and low operation voltage of amorphous oxide TFTs: Electronic structure, electron transport, defects and doping," J. Display Tech., vol. 5, no. 12, pp. 468-483, Dec. 2009.
-
(2009)
J. Display Tech
, vol.5
, Issue.12
, pp. 468-483
-
-
Kamiya, T.1
Nomura, K.2
Hosono, H.3
-
23
-
-
30544448919
-
Preparation and thermal decomposition of indium hydroxide
-
DOI 10.1007/s10973-005-0963-4
-
T. Sato, "Preparation and thermal decomposition of indium hydroxide," J. Thermal Anal. Calorimetry, vol. 82, no. 3, pp. 775-782, Nov. 2005. (Pubitemid 43078540)
-
(2005)
Journal of Thermal Analysis and Calorimetry
, vol.82
, Issue.3
, pp. 775-782
-
-
Sato, T.1
-
24
-
-
0036827556
-
The effect of Sn(IV) on transformation of co-precipitated hydrated In(III) and Sn(IV) hydroxides to indium tin oxide (ITO) powder
-
DOI 10.1016/S0167-577X(02)00574-8, PII S0167577X02005748
-
N. C. Pramanik, S. Das, and P. K. Biswas, "The effect of Sn(IV) on transformation of co-precipitated hydrated in(III) and Sn(IV) hydroxides to indium tin oxide (ITO) powder," Mater. Lett., vol. 56, no. 5, pp. 671-679, Nov. 2002. (Pubitemid 35251702)
-
(2002)
Materials Letters
, vol.56
, Issue.5
, pp. 671-679
-
-
Pramanik, N.C.1
Das, S.2
Kumar Biswas, P.3
-
25
-
-
64349105658
-
Low-voltage ingazno thin-film transistors with al2o3 gate insulator grown by atomic layer deposition
-
Apr
-
J. B. Kim, C. Fuentes-Hernandez, W. J. Potscavage, X.-H. Zhang, and B. Kippelen, "Low-voltage InGaZnO thin-film transistors with Al2O3 gate insulator grown by atomic layer deposition," Appl. Phys. Lett., vol. 94, no. 14, pp. 142107-1-142107-3, Apr. 2009.
-
(2009)
Appl. Phys. Lett
, vol.94
, Issue.14
, pp. 1421071-1421073
-
-
Kim, J.B.1
Fuentes-Hernandez, C.2
Potscavage, W.J.3
Zhang, X.-H.4
Kippelen, B.5
-
26
-
-
44249094185
-
Specific contact resistances between amorphous oxide semiconductor In-Ga-Zn-O and metallic electrodes
-
DOI 10.1016/j.tsf.2007.10.051, PII S0040609007017270
-
Y. Shimura, K. Nomura, H. Yanagi, T. Kamiya, M. Hirano, and H. Hosono, "Specific contact resistances between amorphous oxide semiconductor In-Ga-Zn-O and metallic electrodes," Thin Solid Films, vol. 516, no. 17, pp. 5899-5902, Jul. 2008. (Pubitemid 351726028)
-
(2008)
Thin Solid Films
, vol.516
, Issue.17
, pp. 5899-5902
-
-
Shimura, Y.1
Nomura, K.2
Yanagi, H.3
Kamiya, T.4
Hirano, M.5
Hosono, H.6
-
27
-
-
1542723292
-
Elastomeric transistor stamps: Reversible probing of charge transport in organic crystals
-
DOI 10.1126/science.1094196
-
V. C. Sundar, J. Zaumseil, V. Podzorov, E. Menard, R. L. Willett, T. Someya, et al., "Elastomeric transistor stamps: Reversible probing of charge transport in organic crystals," Science, vol. 303, no. 5664, pp. 1644-1646, Mar. 2004. (Pubitemid 38338317)
-
(2004)
Science
, vol.303
, Issue.5664
, pp. 1644-1646
-
-
Sundar, V.C.1
Zaumseil, J.2
Podzorov, V.3
Menard, E.4
Willett, R.L.5
Someya, T.6
Gershenson, M.E.7
Rogers, J.A.8
-
28
-
-
36449009572
-
Bias-stress-induced stretched-exponential time dependence of charge injection and trapping in amorphous thin film transistors
-
Mar
-
F. R. Libsch and J. Kanicki, "Bias-stress-induced stretched-exponential time dependence of charge injection and trapping in amorphous thin film transistors," Appl. Phys. Lett., vol. 62, no. 11, pp. 1286-1288, Mar. 1993.
-
(1993)
Appl. Phys. Lett
, vol.62
, Issue.11
, pp. 1286-1288
-
-
Libsch, F.R.1
Kanicki, J.2
-
29
-
-
77951877430
-
Influence of illumination on the negative-bias stability of transparent hafnium-indium-zinc oxide thin-film transistors
-
May
-
J. S. Park, T. S. Kim, K. S. Son, J. S. Jung, K.-H. Lee, J.-Y. Kwon, et al., "Influence of illumination on the negative-bias stability of transparent hafnium-indium-zinc oxide thin-film transistors," IEEE Electron Device Lett., vol. 31, no. 5, pp. 440-442, May 2010.
-
(2010)
IEEE Electron Device Lett
, vol.31
, Issue.5
, pp. 440-442
-
-
Park, J.S.1
Kim, T.S.2
Son, K.S.3
Jung, J.S.4
Lee, K.-H.5
Kwon, J.-Y.6
-
30
-
-
84878076703
-
Impact of uv/o3 treatment on solution-processed amorphous ingazno4 thin-film transistors
-
May
-
K. Umeda, T. Miyasako, A. Sugiyama, A. Tanaka, M. Suzuki, E. Tokumitsu, et al., "Impact of UV/O3 treatment on solution-processed amorphous InGaZnO4 thin-film transistors," J. Appl. Phys., vol. 113, no. 18, pp. 184509-1-184509-6, May 2013.
-
(2013)
J. Appl. Phys
, vol.113
, Issue.18
, pp. 1845091-1845096
-
-
Umeda, K.1
Miyasako, T.2
Sugiyama, A.3
Tanaka, A.4
Suzuki, M.5
Tokumitsu, E.6
|