Elastomeric Transistor Stamps: Reversible Probing of Charge Transport in Organic Crystals

Science

Volumn 303, Issue 5664, 2004, Pages 1644-1646

  Sundar, Vikram C ^a,d   Zaumseil, Jana ^a,e   Podzorov, Vitaly ^b   Menard, Etienne ^c   Willett, Robert L ^a   Someya, Takao ^a,f   Gershenson, Michael E ^b   Rogers, John A ^c  

^a LUCENT TECHNOLOGIES   (United States)

^b RUTGERS UNIVERSITY   (United States)

^c University of Illinois at Urbana Champaign   (United States)

^d IBM   (United States)

^e UNIVERSITY OF CAMBRIDGE   (United Kingdom)

^f UNIVERSITY OF TOKYO   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ANISOTROPY; CARRIER MOBILITY; ELASTOMERS; FIELD EFFECT TRANSISTORS;

ANISOTROPIC CHARGE TRANSPORT; ORGANIC CRYSTALS;

CHARGE TRANSFER;

DIMETICONE; ELASTOMER; GOLD; TITANIUM;

CRYSTAL; ELECTRIC FIELD;

ANISOTROPY; ARTICLE; CRYSTAL; ELECTRODE; ELECTRONICS; PRIORITY JOURNAL; SEMICONDUCTOR; X RAY CRYSTALLOGRAPHY; X RAY DIFFRACTION;

EID: 1542723292     PISSN: 00368075     EISSN: None     Source Type: Journal    
DOI: 10.1126/science.1094196     Document Type: Article

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29. V.P. and M.E.G. were supported by NSF grant DMR-0077825. Atomic force microscopy measurements were done in the Center for Microanalysis of Materials at the University of Illinois, Urbana-Champaign (partially funded by U.S. Department of Energy grant DEFG02-91-ER45439). We thank A. Erbe, Y.-L. Loo, K. W. Baldwin, C. Kloc. A. Borissov, V. Kiryukhin, M. Watson, and A. Shim (Dow Corning) for technical support and helpful discussions.