메뉴 건너뛰기




Volumn 1, Issue 1, 2008, Pages 1-31

Suppression of Intrinsic Delay Variation in FPGAs using Multiple Configurations

Author keywords

configuration; FPGA; Reliability; timing yield; within die variation

Indexed keywords


EID: 84896862219     PISSN: 19367406     EISSN: 19367414     Source Type: Journal    
DOI: 10.1145/1331897.1331899     Document Type: Article
Times cited : (9)

References (23)
  • 1
    • 0042912833 scopus 로고    scopus 로고
    • Simulation of intrinsic parameter fluctuations in decananometer and nanometer-scale MOSFET
    • Asenov, A., Brown, A. R., Davis, J. H., Slavcheva, G., 2003. Simulation of intrinsic parameter fluctuations in decananometer and nanometer-scale MOSFET. IEEE Trans. Elect. Devi. 50, 9, 1837-1852.
    • (2003) IEEE Trans. Elect. Devi. , vol.50 , Issue.9 , pp. 1837-1852
    • Asenov, A.1    Brown, A.R.2    Davis, J.H.3    Slavcheva, G.4
  • 4
    • 0034246776 scopus 로고    scopus 로고
    • IMPACT OF EXTRINSIC AND INTRINSIC PARAMETER FLUCTUATIONS ON CMOS CIRCUIT PERFORMANCE
    • Bowman, K. A., Tang, X., Eble, J., Meindl, J. M., 2000. IMPACT OF EXTRINSIC AND INTRINSIC PARAMETER FLUCTUATIONS ON CMOS CIRCUIT PERFORMANCE. IEEE J. Solid-State Circ. 35, 8, 1186-1193.
    • (2000) IEEE J. Solid-State Circ. , vol.35 , Issue.8 , pp. 1186-1193
    • Bowman, K.A.1    Tang, X.2    Eble, J.3    Meindl, J.M.4
  • 5
    • 0036474722 scopus 로고    scopus 로고
    • IMPACT OF DIE-TO-DIE AND WITHIN-DIE PARAMETER FLUCTUATIONS ON THE MAXIMUM CLOCK FREQUENCY DISTRIBUTION FOR GIGASCALE INTEGRATION
    • Bowman, K. A., Duvall, S. G., Meindl, J. M., 2002. IMPACT OF DIE-TO-DIE AND WITHIN-DIE PARAMETER FLUCTUATIONS ON THE MAXIMUM CLOCK FREQUENCY DISTRIBUTION FOR GIGASCALE INTEGRATION. IEEE J. Solid-State Circ. 37, 2, 183-190.
    • (2002) IEEE J. Solid-State Circ. , vol.37 , Issue.2 , pp. 183-190
    • Bowman, K.A.1    Duvall, S.G.2    Meindl, J.M.3
  • 11
    • 33847130112 scopus 로고    scopus 로고
    • A YIELD AND SPEED ENHANCEMENT SCHEME UNDER WITHIN-DIE VARIATIONS ON 90 NM LUT ARRAY
    • IEEE Computer Society Press, Los Alamitos, CA
    • Katsuki, K., Kotani, M., Kobayashi, K., Onodera, H., 2005. A YIELD AND SPEED ENHANCEMENT SCHEME UNDER WITHIN-DIE VARIATIONS ON 90 NM LUT ARRAY. In Proceedings of IEEE Custom Integrated Circuit Conference. IEEE Computer Society Press, Los Alamitos, CA, 601-604.
    • (2005) Proceedings of IEEE Custom Integrated Circuit Conference. , pp. 601-604
    • Katsuki, K.1    Kotani, M.2    Kobayashi, K.3    Onodera, H.4
  • 14
    • 4344561555 scopus 로고    scopus 로고
    • FPGA as process monitor - An effective method to characterize poly gate CD variation and its impact on product performance and yield
    • Li, X., La, F., Ling, T., 2004. FPGA as process monitor - An effective method to characterize poly gate CD variation and its impact on product performance and yield. IEEE Trans. Semiconduct. Manufact. 17, 3, 267-272.
    • (2004) IEEE Trans. Semiconduct. Manufact. , vol.17 , Issue.3 , pp. 267-272
    • Li, X.1    La, F.2    Ling, T.3
  • 19
    • 34547176929 scopus 로고    scopus 로고
    • An adaptive FPGA architecture with process variation compensation and reduced leakage
    • Nabaa, G., Azizi, N., And Najm, F. N., 2006. An adaptive FPGA architecture with process variation compensation and reduced leakage. In Proceedings of Design Automation Conference, 624-629.
    • (2006) Proceedings of Design Automation Conference , pp. 624-629
    • Nabaa, G.1    Azizi, N.2    Najm, F.N.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.