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Volumn 2005, Issue , 2005, Pages 247-254

Defect tolerance in multiple-FPGA systems

Author keywords

[No Author keywords available]

Indexed keywords

DEFECT TOLERANCE; DEFECT-FREE SYSTEMS; MULTIPLE-FPGA SYSTEMS;

EID: 33746930648     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/FPL.2005.1515730     Document Type: Conference Paper
Times cited : (4)

References (15)
  • 2
    • 11944253901 scopus 로고    scopus 로고
    • Cambridge University Press
    • B. Bollobas. Random Graphs. Cambridge University Press, 2001.
    • (2001) Random Graphs
    • Bollobas, B.1
  • 5
    • 0025433611 scopus 로고
    • The use and evaluation of yield models in integrated circuit manufacturing
    • May
    • J. A. Cunningham. The use and evaluation of yield models in integrated circuit manufacturing. IEEE Trans. on Semiconductor Manufacturing, May 1990.
    • (1990) IEEE Trans. on Semiconductor Manufacturing
    • Cunningham, J.A.1
  • 6
    • 0032715091 scopus 로고    scopus 로고
    • A low cost approach for detecting, locating, and avoiding interconnet faults in fpga-based reconfigurable systems
    • D. Das and N. A. Touba. A low cost approach for detecting, locating, and avoiding interconnet faults in fpga-based reconfigurable systems. Proc. of IEEE International Conf. on VLSI Design, 1999.
    • (1999) Proc. of IEEE International Conf. on VLSI Design
    • Das, D.1    Touba, N.A.2
  • 9
    • 0031649068 scopus 로고    scopus 로고
    • Methodologies for tolerating cell and interconnect faults in fpgas
    • January
    • F. Hanchek and S. Dutt. Methodologies for tolerating cell and interconnect faults in fpgas. IEEE Trans. on Computers, January 1998.
    • (1998) IEEE Trans. on Computers
    • Hanchek, F.1    Dutt, S.2
  • 15
    • 0042635605 scopus 로고    scopus 로고
    • Using satisfiability in application-dependent testing of fpga interconnects
    • M. B. Tahoori. Using satisfiability in application-dependent testing of fpga interconnects. Proc. Design and Automation Conference, 2003.
    • (2003) Proc. Design and Automation Conference
    • Tahoori, M.B.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.