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Volumn 14, Issue 2, 2014, Pages 908-914

Inflating graphene with atomic scale blisters

Author keywords

ACTEM; defects; dislocations; electron microscopy; Graphene; HRTEM; TEM

Indexed keywords


EID: 84894118615     PISSN: 15306984     EISSN: 15306992     Source Type: Journal    
DOI: 10.1021/nl404266k     Document Type: Article
Times cited : (41)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.