Reversible defect engineering of single-walled carbon nanotubes using scanning tunneling microscopy

Nano Letters

Volumn 7, Issue 12, 2007, Pages 3623-3627

  Berthe, Maxime ^a,d   Yoshida, Shoji ^a   Ebine, Yuta ^a   Kanazawa, Ken ^a   Okada, Arifumi ^a   Taninaka, Atsushi ^a   Takeuchi, Osamu ^a   Fukui, Nobuyuki ^b   Shinohara, Hisanori ^b   Suzuki, Satoru ^c   Sumitomo, Koji ^c   Kobayashi, Yoshihiro ^c   Grandidier, Bruno ^d   Stiévenard, Didier ^d   Shigekawa, Hidemi ^a  

^a UNIVERSITY OF TSUKUBA   (Japan)

^b NAGOYA UNIVERSITY   (Japan)

^c Kashino Diverse Brain Research Laboratory of NTT Communication Science Laboratories   (Japan)

^d INSTITUT D ELECTRONIQUE   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRONIC PROPERTIES; ENERGY GAP; GOLD; SCANNING TUNNELING MICROSCOPY; SUBSTRATES; SURFACE DEFECTS; SURFACE TREATMENT;

LOCALIZED STATES; SCANNING TUNNELING MICROSCOPES; WALL STRUCTURE;

SINGLE-WALLED CARBON NANOTUBES (SWCN);

EID: 38049159853     PISSN: 15306984     EISSN: None     Source Type: Journal    
DOI: 10.1021/nl071845c     Document Type: Article

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