Susceptibility of smart power ICs to radio frequency interference

IEEE Transactions on Power Electronics

Volumn 29, Issue 6, 2014, Pages 2787-2797

  Fiori, Franco ^a  

^a POLITECNICO DI TORINO   (Italy)

Author keywords

Analog circuits; electromagnetic compatibility (EMC); electromagnetic susceptibility; radio frequency interference (RFI); smart power integrated circuits; substrate coupling

Indexed keywords

EID: 84893911330     PISSN: 08858993     EISSN: None     Source Type: Journal    
DOI: 10.1109/TPEL.2013.2273123     Document Type: Article

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