Criteria to reduce failures induced from conveyed electromagnetic interferences on CMOS operational amplifiers

Microelectronics Reliability

Volumn 37, Issue 1, 1997, Pages 95-113

  Graffi, S ^a   Masetti, G ^a   Piovaccari, A ^a  

^a UNIVERSITY OF BOLOGNA   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITANCE; CASCADE CONNECTIONS; CMOS INTEGRATED CIRCUITS; ELECTROMAGNETIC FIELD EFFECTS; ELECTROMAGNETIC WAVE INTERFERENCE; FAILURE ANALYSIS;

SQUARE WAVE INPUT SIGNALS;

OPERATIONAL AMPLIFIERS;

EID: 0030833533     PISSN: 00262714     EISSN: None     Source Type: Journal    
DOI: 10.1016/0026-2714(96)00242-9     Document Type: Article

References (20)

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