Kuijk bandgap voltage reference with high immunity to EMI

IEEE Transactions on Circuits and Systems II: Express Briefs

Volumn 57, Issue 2, 2010, Pages 75-79

  Redouté, Jean Michel ^a   Steyaert, Michiel ^a  

^a UNIVERSITY OF LEUVEN   (Belgium)

Author keywords

Bandgap voltage references; Electromagnetic compatibility; Electromagnetic interference

Indexed keywords

ELECTROMAGNETIC COMPATIBILITY; ELECTROMAGNETIC PULSE; ELECTROMAGNETIC WAVE INTERFERENCE; SIGNAL INTERFERENCE; VOLTAGE MEASUREMENT;

BANDGAP VOLTAGE REFERENCE; CONDUCTED ELECTROMAGNETIC INTERFERENCE; KUIJK BANDGAP; MEASUREMENTS OF; ORIGINAL STRUCTURES; POWER SUPPLY;

ENERGY GAP;

EID: 77649342577     PISSN: 15497747     EISSN: 15583791     Source Type: Journal    
DOI: 10.1109/TCSII.2009.2037991     Document Type: Article

References (11)

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