Susceptibility of CMOS voltage comparators to radio frequency interference

IEEE Transactions on Electromagnetic Compatibility

Volumn 54, Issue 2, 2012, Pages 434-442

  Fiori, Franco ^a  

^a POLITECNICO DI TORINO   (Italy)

Author keywords

CMOS analog integrated circuits; comparators; electromagnetic interference; nonlinear distortion; reliability

Indexed keywords

CMOS ANALOG INTEGRATED CIRCUITS; HIGH FREQUENCY DISTURBANCE; INITIAL STATE; INPUT SIGNAL; RADIO FREQUENCY INTERFERENCE; RF INTERFERENCE; TEST CHIPS; TIME DOMAIN;

COMPUTER SIMULATION; ELECTROMAGNETIC PULSE; LINEAR INTEGRATED CIRCUITS; NONLINEAR ANALYSIS; NONLINEAR DISTORTION; RELIABILITY; SIGNAL INTERFERENCE;

COMPARATORS (OPTICAL);

EID: 84860193444     PISSN: 00189375     EISSN: None     Source Type: Journal    
DOI: 10.1109/TEMC.2011.2167749     Document Type: Article

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