메뉴 건너뛰기




Volumn 44, Issue 4, 2002, Pages 495-502

A new nonlinear model of EMI-induced distortion phenomena in feedback CMOS operational amplifiers

Author keywords

Demodulation; Electromagnetic compatibility (EMC); Electromagnetic interference (EMI); Harmonic distortion; Operational amplifier

Indexed keywords

CMOS INTEGRATED CIRCUITS; DEMODULATION; ELECTROMAGNETIC COMPATIBILITY; FEEDBACK AMPLIFIERS; HARMONIC DISTORTION; MATHEMATICAL MODELS; RADIO INTERFERENCE; WIRELESS TELECOMMUNICATION SYSTEMS;

EID: 0036881325     PISSN: 00189375     EISSN: None     Source Type: Journal    
DOI: 10.1109/TEMC.2002.804766     Document Type: Article
Times cited : (62)

References (22)
  • 2
    • 0018545592 scopus 로고
    • A modified Ebers-Moll transistor model for RF-interference analysis
    • Nov.
    • C. E. Larson and J. M. Roe, "A modified Ebers-Moll transistor model for RF-interference analysis," IEEE Trans. Electromagn. Compat., vol. EMC-21, pp. 283-290, Nov. 1979.
    • (1979) IEEE Trans. Electromagn. Compat. , vol.EMC-21 , pp. 283-290
    • Larson, C.E.1    Roe, J.M.2
  • 3
    • 0018681389 scopus 로고
    • Quiescent operating point shift in bipolar transistors with AC excitation
    • Dec.
    • R. E. Richardson, "Quiescent operating point shift in bipolar transistors with AC excitation," IEEE J. Solid-State Circuits, vol. SSC-14, pp. 1087-1094, Dec. 1979.
    • (1979) IEEE J. Solid-State Circuits , vol.SSC-14 , pp. 1087-1094
    • Richardson, R.E.1
  • 4
    • 0034187018 scopus 로고    scopus 로고
    • Modified Gummel-Poon model for susceptibility prediction
    • May
    • F. Fiori and V. Pozzolo, "Modified Gummel-Poon model for susceptibility prediction," IEEE Trans. Electromagn. Compat., vol. 42, pp. 206-213, May 2000.
    • (2000) IEEE Trans. Electromagn. Compat. , vol.42 , pp. 206-213
    • Fiori, F.1    Pozzolo, V.2
  • 5
    • 0018546765 scopus 로고
    • Computer-aided analysis of RFI effects in operational amplifiers
    • Nov.
    • J. G. Tront, J. J. Whalen, C. E. Larson, and J. M. Roe, "Computer-aided analysis of RFI effects in operational amplifiers," IEEE Trans. Electromagn. Compat., vol. EMC-21, pp. 297-306, Nov. 1979.
    • (1979) IEEE Trans. Electromagn. Compat. , vol.EMC-21 , pp. 297-306
    • Tront, J.G.1    Whalen, J.J.2    Larson, C.E.3    Roe, J.M.4
  • 6
    • 0026953386 scopus 로고
    • EMI-induced failures in integrated circuit operational amplifier
    • S. Graffi, G. Masetti, and D. Golzio, "EMI-induced failures in integrated circuit operational amplifier," Microelectron. Rel., vol. 32, no. 11, pp. 1551-1557, 1992.
    • (1992) Microelectron. Rel. , vol.32 , Issue.11 , pp. 1551-1557
    • Graffi, S.1    Masetti, G.2    Golzio, D.3
  • 9
    • 0019084308 scopus 로고
    • Macromodel prediction for EMI in bipolar operational amplifiers
    • Nov.
    • G. K. C. Chen and J. J. Whalen, "Macromodel prediction for EMI in bipolar operational amplifiers," IEEE Trans. Electromagn. Compat., vol. EMC-22, pp. 262-265, Nov. 1980.
    • (1980) IEEE Trans. Electromagn. Compat. , vol.EMC-22 , pp. 262-265
    • Chen, G.K.C.1    Whalen, J.J.2
  • 10
    • 0026107990 scopus 로고
    • New macromodels and measurements for the analysis of EMI effects in 741 op-amp circuits
    • Feb.
    • S. Graffi, G. Masetti, and D. Golzio, "New macromodels and measurements for the analysis of EMI effects in 741 op-amp circuits," IEEE Trans. Electromagn. Compat., vol. 33, pp. 25-33, Feb. 1991.
    • (1991) IEEE Trans. Electromagn. Compat. , vol.33 , pp. 25-33
    • Graffi, S.1    Masetti, G.2    Golzio, D.3
  • 12
    • 0002535341 scopus 로고
    • The need for macromodels in the simulation of EMI effects in integrated circuits
    • Rome, Italy, Sept. 13-16
    • J. F. Dawson, J. Wood, W. Persyn, and S. Hagiwara, "The need for macromodels in the simulation of EMI effects in integrated circuits," in Proc. Int. Symp. Electromagnetic Compatibility, Rome, Italy, Sept. 13-16, 1994, pp. 638-643.
    • (1994) Proc. Int. Symp. Electromagnetic Compatibility , pp. 638-643
    • Dawson, J.F.1    Wood, J.2    Persyn, W.3    Hagiwara, S.4
  • 13
    • 0032639862 scopus 로고    scopus 로고
    • Distortion in elementary transistor circuit
    • Mar.
    • W. Sansen, "Distortion in elementary transistor circuit," IEEE Trans. Circuits Syst. II, vol. 46, pp. 315-325, Mar. 1999.
    • (1999) IEEE Trans. Circuits Syst. II , vol.46 , pp. 315-325
    • Sansen, W.1
  • 18
    • 0030833533 scopus 로고    scopus 로고
    • Criteria to reduce failures from conveyed electromagnetic interferences on CMOS operational amplifiers
    • S. Graffi, G. Masetti, and A. Piovaccari, "Criteria to reduce failures from conveyed electromagnetic interferences on CMOS operational amplifiers," Microelectron. Rel., vol. 37, pp. 95-113, 1997.
    • (1997) Microelectron. Rel. , vol.37 , pp. 95-113
    • Graffi, S.1    Masetti, G.2    Piovaccari, A.3
  • 19
    • 0004146230 scopus 로고    scopus 로고
    • Agrate Brianza, Italy: STMicroelectronics
    • _, BCD3s Layout Manual. Agrate Brianza, Italy: STMicroelectronics, 1997.
    • (1997) BCD3s Layout Manual
  • 20


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.