Hard x-ray emission spectroscopy: A powerful tool for the characterization of magnetic semiconductors

Semiconductor Science and Technology

Volumn 29, Issue 2, 2014, Pages

  Rovezzi, M ^a   Glatzel, P ^a  

^a EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

Author keywords

magnetic semiconductors characterization; resonant inelastic x ray scattering; spintronics; synchrotron radiation; x ray emission spectroscopy

Indexed keywords

3D TRANSITION METALS; BULK ELECTRONIC STRUCTURES; CHARACTERIZATION TOOLS; MAGNETIC CHARACTERIZATION; MAGNETIC CIRCULAR DICHROISMS; RESONANT INELASTIC X-RAY SCATTERING; SYNCHROTRON RADIATION SOURCE; X RAY EMISSION SPECTROSCOPY;

ELECTROMAGNETIC WAVE EMISSION; ELECTRONIC STRUCTURE; EMISSION SPECTROSCOPY; MAGNETIC SEMICONDUCTORS; MAGNETOELECTRONICS; SYNCHROTRON RADIATION; TOOLS; X RAY SCATTERING; X RAYS;

CHARACTERIZATION;

EID: 84892646914     PISSN: 02681242     EISSN: 13616641     Source Type: Journal    
DOI: 10.1088/0268-1242/29/2/023002     Document Type: Review

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