X-ray-Raman-scattering-based EXAFS beyond the dipole limit

Journal of Synchrotron Radiation

Volumn 19, Issue 1, 2012, Pages 106-113

  Huotari, Simo ^a,b   Pylkkänen, Tuomas ^a,b   Soininen, J Aleksi ^a   Kas, Joshua J ^c   Hämäläinen, Keijo ^a   Monaco, Giulio ^b  

^a UNIVERSITY OF HELSINKI   (Finland)

^b EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

^c UNIVERSITY OF WASHINGTON   (United States)

Author keywords

extended X ray absorption fine structure; non resonant inelastic X ray scattering; X ray Raman scattering

Indexed keywords

ACCURATE MEASUREMENT; EXAFS; EXTENDED X-RAY ABSORPTION FINE STRUCTURES; NON-DIPOLE CONTRIBUTIONS; NONRESONANT; POLYCRYSTALLINE DIAMONDS; REAL-SPACE; SOFT X-RAY; SOFT-X-RAY ABSORPTION; X-RAY RAMAN SCATTERINGS;

ABSORPTION SPECTRA; EXTENDED X RAY ABSORPTION FINE STRUCTURE SPECTROSCOPY; RAMAN SCATTERING; X RAY ABSORPTION; X RAY SCATTERING;

SCATTERING;

EID: 84255170934     PISSN: 09090495     EISSN: 16005775     Source Type: Journal    
DOI: 10.1107/S0909049511039422     Document Type: Article

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