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Volumn 66, Issue 12, 2005, Pages 2299-2305

Advances in crystal analyzers for inelastic X-ray scattering

Author keywords

C X ray diffraction

Indexed keywords

CRYSTALLINE MATERIALS; SILICON; SPHERES; X RAYS;

CRYSTAL ANALYZERS; FOCAL PROPERTIES; INELASTIC X-RAY SCATTERING (IXS);

X RAY SCATTERING;

EID: 29144520541 PISSN: 00223697 EISSN: None Source Type: Journal
DOI: 10.1016/j.jpcs.2005.09.079 Document Type: Conference Paper

Times cited : (61)

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