SCOPUS 정보 검색 플랫폼

Journal of Electron Spectroscopy and Related Phenomena

Volumn 188, Issue , 2013, Pages 17-25

Reflections on hard x-ray photon-in/photon-out spectroscopy for electronic structure studies

(8) Glatzel, Pieter a Weng, Tsu Chien a Kvashnina, Kristina a Swarbrick, Janine a Sikora, Marcin a Gallo, Erik a,b Smolentsev, Nikolay a,c Mori, Roberto Alonso a

a EUROPEAN SYNCHROTRON RADIATION FACILITY (France)

b UNIVERSITY OF TURIN (Italy)

c SOUTHERN FEDERAL UNIVERSITY (Russian Federation)

Author keywords

Herfd; Rixs; X ray spectroscopy; Xes

Indexed keywords

EMISSION SPECTROSCOPY; PHOTONS; X RAY ABSORPTION; X RAY SPECTROSCOPY; XENON;

EXPERIMENTAL PROTOCOLS; HARD X RAY; HERFD; NONRESONANT; RIXS; X RAY EMISSION SPECTROSCOPY;

ELECTRONIC STRUCTURE;

EID: 84884125166 PISSN: 03682048 EISSN: None Source Type: Journal
DOI: 10.1016/j.elspec.2012.09.004 Document Type: Article

Times cited : (135)

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