Electronic properties of FeSe 1xTe x probed by x-ray emission and absorption spectroscopy

Journal of Physics Condensed Matter

Volumn 24, Issue 41, 2012, Pages

  Simonelli, L ^a   Saini, N L ^b   Mizuguchi, Y ^c,d   Takano, Y ^c,d   Mizokawa, T ^e   Baldi, G ^f   Monaco, G ^a  

^a EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

^b UNIVERSITÀ DI ROMA LA SAPIENZA   (Italy)

^c NATIONAL INSTITUTE FOR MATERIALS SCIENCE   (Japan)

^d JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

^e UNIVERSITY OF TOKYO   (Japan)

^f UNIVERSITY OF PARMA   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

CHALCOGENS; FE K-EDGE; HIGH RESOLUTION; ORBITALS; RESONANT INELASTIC X-RAY SCATTERING; SPECTRAL CHANGE; SPIN STATE; X-RAY EMISSION;

CHALCOGENIDES; CHARGE TRANSFER; ELECTROMAGNETIC WAVE EMISSION; ELECTRONIC PROPERTIES; ELECTRONIC STRUCTURE; SUPERCONDUCTING MATERIALS; SUPERCONDUCTIVITY;

X RAY SCATTERING;

EID: 84866867163     PISSN: 09538984     EISSN: 1361648X     Source Type: Journal    
DOI: 10.1088/0953-8984/24/41/415501     Document Type: Article

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