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Volumn 82, Issue 6, 2011, Pages

Five-element Johann-type x-ray emission spectrometer with a single-photon-counting pixel detector

(11) Kleymenov, Evgeny a,b Van Bokhoven, Jeroen A a,b David, Christian a Glatzel, Pieter c Janousch, Markus a Alonso Mori, Roberto d Studer, Marco a Willimann, Markus a Bergamaschi, Anna a Henrich, Beat a Nachtegaal, Maarten a

a PAUL SCHERRER INSTITUTE (Switzerland)

b ETH ZURICH (Switzerland)

c EUROPEAN SYNCHROTRON RADIATION FACILITY (France)

d SLAC NATIONAL ACCELERATOR LABORATORY (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTROMAGNETIC WAVE EMISSION; LIGHT SOURCES; MOBILE DEVICES; PARTICLE BEAMS; PHOTONS; PIXELS; READOUT SYSTEMS; SPECTROMETERS; X RAYS;

CONCENTRATION DETECTIONS; ENERGY CALIBRATION; ENERGY RESOLUTIONS; SIGNAL-TO-BACKGROUND RATIO; SINGLE PHOTON COUNTING; SPHERICALLY BENT CRYSTALS; SWISS LIGHT SOURCES; SYNCHROTRON TECHNIQUES;

X RAY DETECTORS;

EID: 79960151732 PISSN: 00346748 EISSN: None Source Type: Journal
DOI: 10.1063/1.3600452 Document Type: Article

Times cited : (97)

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