A multi-crystal wavelength dispersive x-ray spectrometer

Review of Scientific Instruments

Volumn 83, Issue 7, 2012, Pages

  Alonso Mori, Roberto ^a   Kern, Jan ^a,b   Sokaras, Dimosthenis ^c   Weng, Tsu Chien ^c   Nordlund, Dennis ^c   Tran, Rosalie ^b   Montanez, Paul ^a   Delor, James ^a   Yachandra, Vittal K ^b   Yano, Junko ^b   Bergmann, Uwe ^a  

^a SLAC NATIONAL ACCELERATOR LABORATORY   (United States)

^b LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

^c SLAC NATIONAL ACCELERATOR LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CATALYTIC REACTIONS; FEMTOSECONDS; HARD X RAY; HIGH-ENERGY RESOLUTION; PHOTOINDUCED PROCESS; RESONANT INELASTIC X-RAY SCATTERING; SINGLE-SHOT; SOLID ANGLE; SYNCHROTRON RADIATION FACILITY; TEMPORAL PROFILE; TIME-DEPENDENT SYSTEMS; TIME-RESOLVED; WAVELENGTH DISPERSIVE; WAVELENGTH DISPERSIVE X-RAY SPECTROMETERS; X RAY EMISSION SPECTROSCOPY; X-RAY FREE ELECTRON LASERS; X-RAY RAMAN SCATTERINGS;

CATALYSIS; DISPERSION (WAVES); EMISSION SPECTROSCOPY; FREE ELECTRON LASERS; RADIATION DAMAGE; REACTION KINETICS; SPECTROMETERS; SPECTROMETRY; X RAY SCATTERING; X RAY SPECTROMETERS;

X RAYS;

ARTICLE; EQUIPMENT; EQUIPMENT DESIGN; INSTRUMENTATION; RAMAN SPECTROMETRY; SPECTROMETRY; TRANSDUCER; X RAY PHOTOELECTRON SPECTROSCOPY;

EQUIPMENT DESIGN; EQUIPMENT FAILURE ANALYSIS; PHOTOELECTRON SPECTROSCOPY; SPECTROMETRY, X-RAY EMISSION; SPECTRUM ANALYSIS, RAMAN; TRANSDUCERS;

EID: 84866840402     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4737630     Document Type: Review

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