Advanced methods for the analysis of x-ray absorption spectroscopy data applied to semiconductors

Semiconductor Science and Technology

Volumn 26, Issue 6, 2011, Pages

  D'Acapito, Francesco ^a  

^a IOM CNR LABORATORIO TASC   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

AB INITIO; ATOMIC STRUCTURE; BOND DISTANCE; DATA ANALYSIS; DOPANT SPECIES; EXPERIMENTAL DATA; EXPERIMENTAL TECHNIQUES; LOCAL STRUCTURE; MATRIX; QUANTITATIVE DETERMINATIONS; SEMICONDUCTING CRYSTALS; STRUCTURAL PARAMETER;

ABSORPTION; ATOMIC SPECTROSCOPY; CRYSTAL ATOMIC STRUCTURE; DATA REDUCTION; X RAY ABSORPTION; X RAY ABSORPTION SPECTROSCOPY;

ABSORPTION SPECTROSCOPY;

EID: 79953867334     PISSN: 02681242     EISSN: 13616641     Source Type: Journal    
DOI: 10.1088/0268-1242/26/6/064004     Document Type: Article

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