A von Hamos x-ray spectrometer based on a segmented-type diffraction crystal for single-shot x-ray emission spectroscopy and time-resolved resonant inelastic x-ray scattering studies

Review of Scientific Instruments

Volumn 83, Issue 10, 2012, Pages

  Szlachetko, J ^a,b   Nachtegaal, M ^a   De Boni, E ^a   Willimann, M ^a   Safonova, O ^a   Sa, J ^a   Smolentsev, G ^a   Szlachetko, M ^a   Van Bokhoven, J A ^a,c   Dousse, J Cl ^d   Hoszowska, J ^d   Kayser, Y ^d   Jagodzinski, P ^e   Bergamaschi, A ^a   Schmitt, B ^a   David, C ^a   Lucke A ^a  

^a PAUL SCHERRER INSTITUTE   (Switzerland)

^b JAN KOCHANOWSKI UNIVERSITY   (Poland)

^c ETH ZURICH   (Switzerland)

^d UNIVERSITY OF FRIBOURG   (Switzerland)

^e University of Technology   (Poland)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL PREPARATION; ENERGY RANGES; ENERGY RESOLUTIONS; RESONANT INELASTIC X-RAY SCATTERING; SINGLE-SHOT; SPECTROMETER RESOLUTIONS; TIME-RESOLVED; X RAY EMISSION SPECTROSCOPY;

ELECTROMAGNETIC WAVE EMISSION; EMISSION SPECTROSCOPY; SPECTROMETRY; X RAY DIFFRACTION; X RAY SCATTERING;

SPECTROMETERS;

EID: 84868383953     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4756691     Document Type: Conference Paper

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