-
3
-
-
0001959767
-
-
M. Chhowalla, Y. Yin, G. A. J. Amaratunga, D. R. McKenzie, T. Frauenheim, Diam. Relat. Mater. 6 (1997) 207.
-
(1997)
Diam. Relat. Mater.
, vol.6
, pp. 207
-
-
Chhowalla, M.1
Yin, Y.2
Amaratunga, G.A.J.3
McKenzie, D.R.4
Frauenheim, T.5
-
4
-
-
34748822416
-
-
A. A. Voevodin, S. J. P. Laube, S. D. Walck, J. S. Solomon, M. S. Donley, J. S. Zabinski, J. Appl. Phys. 78 (1995) 4123.
-
(1995)
J. Appl. Phys.
, vol.78
, pp. 4123
-
-
Voevodin, A.A.1
Laube, S.J.P.2
Walck, S.D.3
Solomon, J.S.4
Donley, M.S.5
Zabinski, J.S.6
-
6
-
-
0038567727
-
Deposition and processing of thin films
-
H. S. Nalwa (ed.), Chap. 9, Academic Press, San Diego, CA
-
Y. Pauleau, Deposition and processing of thin films, in H. S. Nalwa (ed.) Handbook of Thin Film Materials, Vol. 1, Chap. 9, Academic Press, San Diego, CA, 2002, p. 455.
-
(2002)
Handbook of Thin Film Materials
, vol.1
, pp. 455
-
-
Pauleau, Y.1
-
8
-
-
0004315682
-
-
Chap. VI, Giro Press, Croton-on-Hudson, NY
-
E. S. Machlin, Materials Science in Microelectronics, The Relationship between Thin Film Processing and Structure, Chap.VI, Giro Press, Croton-on-Hudson, NY, 1995, p. 157.
-
(1995)
Materials Science in Microelectronics, the Relationship between Thin Film Processing and Structure
, pp. 157
-
-
Machlin, E.S.1
-
12
-
-
0000984103
-
Sputtering by particle bombardment i
-
R. Behrisch (ed.), Chap. 2, Springer, Berlin
-
P. Sigmund, Sputtering by particle bombardment I, in R. Behrisch (ed.) Topics in Applied Physics, Vol. 47, Chap. 2, Springer, Berlin, 1981.
-
(1981)
Topics in Applied Physics
, vol.47
-
-
Sigmund, P.1
-
15
-
-
0000202890
-
-
J. E. Yehoda, B. Yang, K. Vedam, R. Messier, J. Vac. Sci. Technol. A, 6 (1988) 1631.
-
(1988)
J. Vac. Sci. Technol. A
, vol.6
, pp. 1631
-
-
Yehoda, J.E.1
Yang, B.2
Vedam, K.3
Messier, R.4
-
18
-
-
0004315682
-
-
Chap. VI, Giro Press, Croton-on-Hudson, NY
-
E. S. Machlin, Materials Science in Microelectronics: The Relationship between Thin Film Processing and Structure, Chap. VI, Giro Press, Croton-on-Hudson, NY, 1995, p. 179.
-
(1995)
Materials Science in Microelectronics: The Relationship between Thin Film Processing and Structure
, pp. 179
-
-
Machlin, E.S.1
-
21
-
-
84890007521
-
Current topics in materials science
-
E. Kaldis (ed.), North-Holland, Amsterdam, The Netherlands
-
G. Gille, in Current topics in materials science, in E. Kaldis (ed.), Mechanical Properties of Brittle Materials, Vol. 12, North-Holland, Amsterdam, The Netherlands, 1985, pp. 317-364.
-
(1985)
Mechanical Properties of Brittle Materials
, vol.12
, pp. 317-364
-
-
Gille, G.1
-
26
-
-
3843122164
-
Interface structure, adhesion and ion beam processing
-
Y. Pauleau (ed.), NATO-ASI Series, Series E: Applied Sciences, Kluwer Academic, Dordrecht, The Netherlands
-
J. E. E. Baglin, Interface structure, adhesion and ion beam processing, in Y. Pauleau (ed.) Materials and Processes for Surface and Interface Engineering, Vol. 290, NATO-ASI Series, Series E: Applied Sciences, Kluwer Academic, Dordrecht, The Netherlands, 1995, p. 111.
-
(1995)
Materials and Processes for Surface and Interface Engineering
, vol.290
, pp. 111
-
-
Baglin, J.E.E.1
-
29
-
-
0242607874
-
-
M. M. Morshed, B. P. McNamara, D. C. Cameron, M. S. J. Hashmi, J. Mater. Proc. Technol. 143-144 (2003) 922.
-
(2003)
J. Mater. Proc. Technol.
, vol.143-144
, pp. 922
-
-
Morshed, M.M.1
McNamara, B.P.2
Cameron, D.C.3
Hashmi, M.S.J.4
-
32
-
-
27744578686
-
-
I. Ohlidal, M. Ohlidal, D. Franta, V. Cudek, V. Bursikova, P. Klapetek, K. Palenikova, Diam. Relat. Mater. 14 (2005) 1835.
-
(2005)
Diam. Relat. Mater.
, vol.14
, pp. 1835
-
-
Ohlidal, I.1
Ohlidal, M.2
Franta, D.3
Cudek, V.4
Bursikova, V.5
Klapetek, P.6
Palenikova, K.7
-
33
-
-
0003427458
-
-
M. Cohen, (ed.), Addison-Wesley, Reading, MA
-
B. D. Cullity, in Elements of X-ray Diffraction, M. Cohen, (ed.), Addison-Wesley, Reading, MA, 1978, p. 454.
-
(1978)
Elements of X-ray Diffraction
, pp. 454
-
-
Cullity, B.D.1
-
34
-
-
0033573534
-
-
S. Zhang, H. Xie, X. Zeng, P. Hing, Surf. Coat. Technol. 122 (1999) 219.
-
(1999)
Surf. Coat. Technol.
, vol.122
, pp. 219
-
-
Zhang, S.1
Xie, H.2
Zeng, X.3
Hing, P.4
-
37
-
-
0003440116
-
-
L.-H. Lee, (ed.), Chap. 13, Plenum Publishing, New York
-
J. E. E. Baglin, in Fundamentals of Adhesion, L.-H. Lee, (ed.), Chap. 13, Plenum Publishing, New York, 1990, p. 363.
-
(1990)
Fundamentals of Adhesion
, pp. 363
-
-
Baglin, J.E.E.1
-
38
-
-
0034124182
-
-
I. Sh. Trakhtenberg, O. M. Bakunin, I. N. Korneyev, S. A. Plotnikov, A.P. Rubshtein, K. Uemura, Diam. Relat. Mater. 9 (2000) 711.
-
(2000)
Diam. Relat. Mater.
, vol.9
, pp. 711
-
-
Trakhtenberg, I.Sh.1
Bakunin, O.M.2
Korneyev, I.N.3
Plotnikov, S.A.4
Rubshtein, A.P.5
Uemura, K.6
-
41
-
-
84889955322
-
Standard methods for measuring adhesion by tape test
-
Standard Methods for Measuring Adhesion by Tape Test, ASTM Designation D 3359-83 668.
-
ASTM Designation D
, vol.668
, pp. 3359-3383
-
-
-
42
-
-
0033683416
-
-
Y. Funada, K. Awazu, H. Yasui, T. Sugita, Surf. Coat. Technol. 128-129 (2000) 308.
-
(2000)
Surf. Coat. Technol.
, vol.128-129
, pp. 308
-
-
Funada, Y.1
Awazu, K.2
Yasui, H.3
Sugita, T.4
-
43
-
-
0343371542
-
-
K.-R. Lee, K. Y. Eun, I. Kim, J. Kim, Thin Solid Films 377-378 (2000) 261.
-
(2000)
Thin Solid Films
, vol.377-378
, pp. 261
-
-
Lee, K.-R.1
Eun, K.Y.2
Kim, I.3
Kim, J.4
-
47
-
-
23044495323
-
-
T. Mikami, H. Nakazawa, M. Kudo, M. Mashita, Thin Solid Films 488 (2005) 87.
-
(2005)
Thin Solid Films
, vol.488
, pp. 87
-
-
Mikami, T.1
Nakazawa, H.2
Kudo, M.3
Mashita, M.4
-
49
-
-
0029487828
-
-
W. Heinke, A. Leyland, A. Matthews, G. Berg, C. Friedrich, E. Broszeit, Thin Solid Films 270 (1995) 431.
-
(1995)
Thin Solid Films
, vol.270
, pp. 431
-
-
Heinke, W.1
Leyland, A.2
Matthews, A.3
Berg, G.4
Friedrich, C.5
Broszeit, E.6
-
50
-
-
0037793039
-
-
M. M. Morshed, D. C. Cameron, B. P. McNamara, M. S. J. Hashmi, Surf. Coat. Technol. 169-170 (2003) 254.
-
(2003)
Surf. Coat. Technol.
, vol.169-170
, pp. 254
-
-
Morshed, M.M.1
Cameron, D.C.2
McNamara, B.P.3
Hashmi, M.S.J.4
-
51
-
-
17644369646
-
-
Y. Oka, M. Kirinuki, Y. Nishimura, K. Azuma, E. Fujiwara, M. Yatsuzuka, Surf. Coat. Teechnol. 186 (2004) 141.
-
(2004)
Surf. Coat. Teechnol.
, vol.186
, pp. 141
-
-
Oka, Y.1
Kirinuki, M.2
Nishimura, Y.3
Azuma, K.4
Fujiwara, E.5
Yatsuzuka, M.6
-
52
-
-
0033148943
-
-
S. Kumar, D. Sarangi, P. N. Dixit, O. S. Panwar, R. Bhattacharyya, Thin Solid Films 346 (1999) 130.
-
(1999)
Thin Solid Films
, vol.346
, pp. 130
-
-
Kumar, S.1
Sarangi, D.2
Dixit, P.N.3
Panwar, O.S.4
Bhattacharyya, R.5
-
53
-
-
0037219895
-
-
M. Ban, T. Hasegawa, S. Fujii, J. Fujioka, Diam. Relat. Mater., 12 (2003) 47.
-
(2003)
Diam. Relat. Mater.
, vol.12
, pp. 47
-
-
Ban, M.1
Hasegawa, T.2
Fujii, S.3
Fujioka, J.4
-
54
-
-
0000879286
-
-
P. J. Fallon, V. S. Veerasamy, C. A. Davis, J. Robertson, G. A. J. Amaratunga, W. I. Milne, J. Koskinen, Phys. Rev. B 48 (1993) 4777.
-
(1993)
Phys. Rev. B
, vol.48
, pp. 4777
-
-
Fallon, P.J.1
Veerasamy, V.S.2
Davis, C.A.3
Robertson, J.4
Amaratunga, G.A.J.5
Milne, W.I.6
Koskinen, J.7
-
55
-
-
0009355065
-
-
S. Xu, D. Flynn, B. K. Tay, S. Prawer, K. W. Nugent, S. R. P. Silva, Y. Lifshitz, W.I. Milne, Philos. Mag. B 76 (1997) 351.
-
(1997)
Philos. Mag. B
, vol.76
, pp. 351
-
-
Xu, S.1
Flynn, D.2
Tay, B.K.3
Prawer, S.4
Nugent, K.W.5
Silva, S.R.P.6
Lifshitz, Y.7
Milne, W.I.8
-
57
-
-
0008826819
-
-
J. Bottiger, J. A. Davies, P. Sigmund, K. B. Winterbon, Radiat. Effects 11 (1971) 69.
-
(1971)
Radiat. Effects
, vol.11
, pp. 69
-
-
Bottiger, J.1
Davies, J.A.2
Sigmund, P.3
Winterbon, K.B.4
-
59
-
-
0004982292
-
New diamond and diamond-like films
-
P. Vincenzini (ed.), Techna srl, Faenza, Italy
-
E. Mounier, E. Quesnel, Y. Pauleau, New diamond and diamond-like films, in P. Vincenzini (ed.), Proceedings of the Topical Symposium II on New Diamond and Diamond-Like Films of the 8th CIMTEC-World Ceramic Congress and Forum on New Materials, Advances in Science and Technology 6, Vol. 6, Techna srl, Faenza, Italy, 1995, p. 183.
-
(1995)
Proceedings of the Topical Symposium II on New Diamond and Diamond-Like Films of the 8th CIMTEC-World Ceramic Congress and Forum on New Materials, Advances in Science and Technology 6
, vol.6
, pp. 183
-
-
Mounier, E.1
Quesnel, E.2
Pauleau, Y.3
-
60
-
-
0004982291
-
Protective coatings and thin films: Synthesis, characterization and applications
-
Y. Pauleau and P.B. Barna (eds), Kluwer Academic, Dordrecht, The Netherlands
-
Y. Pauleau, E. Mounier, P. Juliet, Protective Coatings and Thin Films: Synthesis, Characterization and Applications, NATO-ASI Series, Partnership Sub-Series 3: High Technology, Vol. 21, Y. Pauleau and P.B. Barna (eds), Kluwer Academic, Dordrecht, The Netherlands, 1997, p. 197.
-
(1997)
NATO-ASI Series, Partnership Sub-Series 3: High Technology
, vol.21
, pp. 197
-
-
Pauleau, Y.1
Mounier, E.2
Juliet, P.3
-
67
-
-
1342281321
-
-
S. Takeuchi, A. Tanji, H. Miyazawa, M. Murakawa, Thin Solid Films 447-448 (2004) 208.
-
(2004)
Thin Solid Films
, vol.447-448
, pp. 208
-
-
Takeuchi, S.1
Tanji, A.2
Miyazawa, H.3
Murakawa, M.4
-
68
-
-
0031207991
-
-
W. C. Vassell, A. K. Gangopadhyay, T. J. Potter, M. A. Tamor, M.J. Rokosz, JMEPEG 6 (1997) 426.
-
(1997)
JMEPEG
, vol.6
, pp. 426
-
-
Vassell, W.C.1
Gangopadhyay, A.K.2
Potter, T.J.3
Tamor, M.A.4
Rokosz, M.J.5
-
71
-
-
18144439530
-
-
L. Niederberger, H. Holleck, H. Leiste, M. Stüber, S. Ulrich, H. Baumann, Surf. Coat. Technol. 174-175 (2003) 708.
-
(2003)
Surf. Coat. Technol.
, vol.174-175
, pp. 708
-
-
Niederberger, L.1
Holleck, H.2
Leiste, H.3
Stüber, M.4
Ulrich, S.5
Baumann, H.6
-
72
-
-
0034310618
-
-
J. C. Damasceno, S. S. Camargo Jr., F. L. Freire Jr., R. Carius, Surf. Coat. Technol. 133-134 (2000) 247.
-
(2000)
Surf. Coat. Technol.
, vol.133-134
, pp. 247
-
-
Damasceno, J.C.1
Camargo Jr., S.S.2
Freire Jr., F.L.3
Carius, R.4
-
73
-
-
0033513906
-
-
D. H. Lee, S. Fayeulle, K. C. Walter, M. Nastasi, Nucl. Instrum. Methods Phys. B 148 (1999) 216.
-
(1999)
Nucl. Instrum. Methods Phys. B
, vol.148
, pp. 216
-
-
Lee, D.H.1
Fayeulle, S.2
Walter, K.C.3
Nastasi, M.4
-
74
-
-
0038413479
-
-
Y. Oka, M. Tao, Y. Nishimura, K. Azuma, E. Fujiwara, M. Yatsuzuka, Nucl. Instrum. Methods Phys. B 206 (2003) 700.
-
(2003)
Nucl. Instrum. Methods Phys. B
, vol.206
, pp. 700
-
-
Oka, Y.1
Tao, M.2
Nishimura, Y.3
Azuma, K.4
Fujiwara, E.5
Yatsuzuka, M.6
-
77
-
-
4243349342
-
-
J. P. Hirvonen, J. Koskinen, I. Koponen, J. Likonen, H. Kattelus, Nucl. Instrum Methods Phys. B 80 (1997) 1472.
-
(1997)
Nucl. Instrum Methods Phys. B
, vol.80
, pp. 1472
-
-
Hirvonen, J.P.1
Koskinen, J.2
Koponen, I.3
Likonen, J.4
Kattelus, H.5
-
78
-
-
0000075431
-
-
T. A. Friedmann, J. P. Sullivan, J. A. Knapp, D. R. Tallant, D. M. Follstaedt, D. L. Medlin, P. B. Mirkarimi, Appl. Phys. Lett. 71 (1997) 3820.
-
(1997)
Appl. Phys. Lett.
, vol.71
, pp. 3820
-
-
Friedmann, T.A.1
Sullivan, J.P.2
Knapp, J.A.3
Tallant, D.R.4
Follstaedt, D.M.5
Medlin, D.L.6
Mirkarimi, P.B.7
-
79
-
-
0034696091
-
-
S. Yang, D. Camino, A. H. S. Jones, D. G. Teer, Surf. Coat. Technol. 124 (2000) 110.
-
(2000)
Surf. Coat. Technol.
, vol.124
, pp. 110
-
-
Yang, S.1
Camino, D.2
Jones, A.H.S.3
Teer, D.G.4
-
81
-
-
0033941417
-
-
V. V. Uglov, A. K. Kuleshov, D. P. Rusalsky, J. I. Onate, S. Z. Yang, Surf. Coat. Technol. 129 (2000) 150.
-
(2000)
Surf. Coat. Technol.
, vol.129
, pp. 150
-
-
Uglov, V.V.1
Kuleshov, A.K.2
Rusalsky, D.P.3
Onate, J.I.4
Yang, S.Z.5
-
82
-
-
0034296230
-
-
K. Bewilogua, C. V. Cooper, C. Specht, J. Schröder, R. Wittorf, M. Grischke, Surf. Coat. Technol. 132 (2000) 275.
-
(2000)
Surf. Coat. Technol.
, vol.132
, pp. 275
-
-
Bewilogua, K.1
Cooper, C.V.2
Specht, C.3
Schröder, J.4
Wittorf, R.5
Grischke, M.6
-
84
-
-
0042908609
-
-
M. Stüber, S. Ulrich, H. Leiste, A. Kratzsch, H. Holleck, Surf. Coat. Technol. 116-119 (1999) 591.
-
(1999)
Surf. Coat. Technol.
, vol.116-119
, pp. 591
-
-
Stüber, M.1
Ulrich, S.2
Leiste, H.3
Kratzsch, A.4
Holleck, H.5
-
85
-
-
17644435118
-
-
J. S. Chen, S. P. Lau, Z. Sun, G. Y. Chen, Y. J. Li, B. K. Tay, J. W. Chai, Thin Solid Films 398-399 (2001) 110.
-
(2001)
Thin Solid Films
, vol.398-399
, pp. 110
-
-
Chen, J.S.1
Lau, S.P.2
Sun, Z.3
Chen, G.Y.4
Li, Y.J.5
Tay, B.K.6
Chai, J.W.7
-
90
-
-
0030185150
-
-
A. Erdemir, C. Bindal, G. R. Fenske, P. J. Wilbur, Tribology Trans. 39 (1996) 735.
-
(1996)
Tribology Trans.
, vol.39
, pp. 735
-
-
Erdemir, A.1
Bindal, C.2
Fenske, G.R.3
Wilbur, P.J.4
-
92
-
-
0035449752
-
-
I. Sh. Trakhtenberg, A. B. Vladimirov, S. A. Plotnikov, A. P. Rubshtein, V. B. Vykhodets, O. M. Bakunin, Diam. Relat. Mater. 10 (2001) 1824.
-
(2001)
Diam. Relat. Mater.
, vol.10
, pp. 1824
-
-
Trakhtenberg, I.Sh.1
Vladimirov, A.B.2
Plotnikov, S.A.3
Rubshtein, A.P.4
Vykhodets, V.B.5
Bakunin, O.M.6
-
93
-
-
20744444579
-
-
J. Tian, Q. Zhang, Q. Zhou, R. Gruenwald, M. Huesgen, S. F. Yoon, J. Ahn, Surf. Coat. Technol. 198 (2005) 198.
-
(2005)
Surf. Coat. Technol.
, vol.198
, pp. 198
-
-
Tian, J.1
Zhang, Q.2
Zhou, Q.3
Gruenwald, R.4
Huesgen, M.5
Yoon, S.F.6
Ahn, J.7
-
95
-
-
18144441262
-
-
M. M. Morshed, D. C. Cameron, B. P. McNamara, M. S. J. Hashmi, Surf. Coat. Technol. 174-175 (2003) 579.
-
(2003)
Surf. Coat. Technol.
, vol.174-175
, pp. 579
-
-
Morshed, M.M.1
Cameron, D.C.2
McNamara, B.P.3
Hashmi, M.S.J.4
-
96
-
-
33645223330
-
-
N. Yamauchi, K. Demizu, N. Ueda, T. Sone, M. Tsujikawa, Y. Hirose, Thin Solid Films 506-507 (2006) 378.
-
(2006)
Thin Solid Films
, vol.506-507
, pp. 378
-
-
Yamauchi, N.1
Demizu, K.2
Ueda, N.3
Sone, T.4
Tsujikawa, M.5
Hirose, Y.6
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