Structural, optical and chemical analysis of zinc sulfide thin film deposited by RF-mganetron sputtering and post deposition annealing

Metals and Materials International

Volumn 19, Issue 6, 2013, Pages 1309-1316

  Yoo, Dongjun ^a   Choi, Moon Suk ^a   Heo, Seung Chan ^a   Chung, Chulwon ^a   Kim, Dohyung ^a   Choi, Changhwan ^a  

^a Hanyang University   (South Korea)

Author keywords

annealing; phase transformation; scanning electron microscopy; solar cells; ZnS

Indexed keywords

ANNEALING; BLENDING; CHEMICAL ANALYSIS; ENERGY GAP; FILM GROWTH; GRAIN GROWTH; II-VI SEMICONDUCTORS; MAGNETRON SPUTTERING; OXIDE MINERALS; PHASE TRANSITIONS; SCANNING ELECTRON MICROSCOPY; SOLAR CELLS; SULFUR COMPOUNDS; THIN FILMS; X RAY POWDER DIFFRACTION; ZINC; ZINC METALLOGRAPHY; ZINC OXIDE;

HEXAGONAL WURTZITE; OPTICAL BAND GAP ENERGY; OXYGEN CONTAINING ATMOSPHERE; POST DEPOSITION ANNEALING; PROCESS PARAMETERS; RADIO FREQUENCY MAGNETRON SPUTTERING; ZINC SULFIDE (ZNS); ZINC SULFIDE THIN FILMS;

ZINC SULFIDE;

EID: 84888416071     PISSN: 15989623     EISSN: 20054149     Source Type: Journal    
DOI: 10.1007/s12540-013-6026-7     Document Type: Article

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