Nanocrystalline ZnS thin films by chemical bath deposition method and its characterization

Surface and Interface Analysis

Volumn 44, Issue 8, 2012, Pages 1214-1218

  Salim, S M ^a   Eid, A H ^a   Salem, A M ^a   Abou El Khair, H M ^a  

^a NATIONAL RESEARCH CENTRE   (Egypt)

Author keywords

Chemical deposition; optical properties; SEM; structure; Thin Films; Zinc sulfide

Indexed keywords

AQUEOUS AMMONIA; AVERAGE SIZE; CHEMICAL BATH; CHEMICAL BATH DEPOSITION METHODS; CHEMICAL DEPOSITION; CHEMICAL-BATH DEPOSITION; CUBIC STRUCTURE; GROWTH CONDITIONS; HIGH TRANSMISSION; NANOCRYSTALLINE THIN FILMS; NANOCRYSTALLINES; POLYCRYSTALLINE; POTENTIAL APPLICATIONS; PRECURSOR SOLUTIONS; QUANTUM SIZE EFFECTS; SAMPLE SURFACE; SCANNING ELECTRON MICROSCOPE; SCHERRER FORMULA; TYPICAL VALUES; WIDE BAND GAP; WIDE-BAND-GAP SEMICONDUCTOR; WINDOW LAYER; X-RAY DIFFRACTION STUDIES; ZINC CHLORIDE; ZNO; ZNS FILMS; ZNS THIN FILMS;

AMMONIA; CHLORINE COMPOUNDS; DEPOSITION; ENERGY GAP; OPTICAL PROPERTIES; OPTOELECTRONIC DEVICES; SCANNING ELECTRON MICROSCOPY; STOICHIOMETRY; STRUCTURE (COMPOSITION); SUBSTRATES; THIN FILMS; THIOUREAS; VAPOR DEPOSITION; X RAY DIFFRACTION ANALYSIS; ZINC; ZINC OXIDE;

ZINC SULFIDE;

EID: 84864467755     PISSN: 01422421     EISSN: 10969918     Source Type: Journal    
DOI: 10.1002/sia.5018     Document Type: Conference Paper

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