X-ray photoelectron spectroscopy study of nitrogen and aluminum-nitrogen doped ZnO films

Acta Physica Polonica A

Volumn 124, Issue 5, 2013, Pages 858-861

  Ievtushenko, A ^a   Khyzhun, O ^a   Shtepliuk, I ^a   Tkach, V ^b   Lazorenko, V ^a   Lashkarev, G ^a  

^a FRANTSEVICH INSTITUTE FOR PROBLEMS OF MATERIALS SCIENCE   (Ukraine)

^b BAKUL INSTITUTE FOR SUPERHARD MATERIALS   (Ukraine)

Author keywords

[No Author keywords available]

Indexed keywords

CO-DOPED ZNO; DOPED ZNO; LAYER-BY-LAYER METHODS; NITROGEN-DOPED; SI SUBSTRATES; VALENCE BAND SPECTRA; X-RAY PHOTOELECTRON SPECTROSCOPY STUDIES; ZNO MATRIX;

ALUMINUM; DOPING (ADDITIVES); ELECTRONIC PROPERTIES; METALLIC FILMS; NITROGEN; PHOTOELECTRONS; X RAY PHOTOELECTRON SPECTROSCOPY;

ALUMINUM COATINGS;

EID: 84887971538     PISSN: 05874246     EISSN: 1898794X     Source Type: Journal    
DOI: 10.12693/APhysPolA.124.858     Document Type: Article

References (22)

1. G.V. Lashkarev, V.A. Karpyna, V.I. Lazorenko, A.I. Ievtushenko, I.I. Shtepliuk, V.D. Khranovskyy, Low Temp. Phys. 37, 226 (2011).
2. V.A. Karpina, V.I. Lazorenko, C.V. Lashkarev, V.D. Dobrowolski, L.I. Kopylova, V.A. Baturin, S.A. Pustovoytov, A. Ju. Karpenko, S.A. Eremin, P.M. Lytvyn, V.P. Ovsyannikov, E.A. Mazurenko, Cryst. Res. Technol. 39, 980 (2004).
3. J.-H. Kang, D.W. Kim, J.H. Kim, Y.S. Lim, M.-H. Lee, W.-S. Seo, H.J. Choi, K.H. Seo, M.G. Park, Thin Solid Films 519, 6840 (2011).
4. H. von Wenckstern, H. Schmidt, M. Brandt, A. Lajn, R. Pickenhain, M. Lorenz, M. Grundmann, D.M. Hofmann, A. Polity, B.K. Meyer, H. Saal, M. Binnewies, A. Börger, K.-D. Becker, V.A. Tikhomirov, K. Jug, Prog. Solid State Chem. 37, 153 (2009).
5. T. Yamamoto, H. Katayama-Yoshida, J. Cryst. Growth 214/215, 552 (2000).
6. A.I. Ievtushenko, G.V. Lashkarev, V.I. Lazorenko, V.A. Karpyna, M.G. Dusheyko, V.M. Tkach, L.A. Kosyachenko, V.M. Sklyarchuk, O.F. Sklyarchuk, K.A. Avramenko, V.V. Strelchuk, Zs.J. Horvath, Phys. Status Solidi A 207, 1746 (2010).
7. L.A. Kosyachenko, G.V. Lashkarev, V.M. Sklyarchuk, A.I. Ievtushenko, O.F. Sklyarchuk, V.I. Lazorenko, A. Ulyashin, Phys. Status Solidi A 207, 1972 (2010).
8. L.A. Kosyachenko, G.V. Lashkarev, A.I. Ievtushenko, V.I. Lazorenko, V.M. Sklyarchuk, O.F. Sklyarchuk, Acta Phys. Pol. A 119, 681 (2011).
9. A.I. Ievtushenko, G.V. Lashkaryov, V.V. Strelchuk, V.I. Lazorenko, L.O. Klochkov, O.S. Lytvyn, V.M. Tkach, A.S. Romanyuk, K.A. Avramenko, O.I. Bykov, V.A. Baturin, A.Y. Karpenko, Metalloz. Nov. Tekhnol. 33, 243 (2011).
10. A. Ievtushenko, V. Karpyna, G. Lashkarev, V. Lazorenko, V. Baturin, A. Karpenko, M. Lunika, A. Dan'ko, Acta Phys. Pol. A 114, 1131 (2008).
11. A.I. Ievtushenko, V.A. Karpyna, V.I. Lazorenko, G.V. Lashkarev, V.D. Khranovskyy, V.A. Baturin, O.Y. Karpenko, M.M. Lunika, K.A. Avramenko, V.V. Strelchuk, O.M. Kutsay, Thin Solid Films 518, 4529 (2010).
12. I. Shtepliuk, G. Lashkarev, O. Khyzhun, B. Kowalski, A. Reszka, V. Khomyak, V. Lazorenko, I. Timofeeva, Acta Phys. Pol. A 120, 914 (2011).
13. I. Shtepliuk, O. Khyzhun, G. Lashkarev, V. Khomyak, V. Lazorenko, I. Timofeeva, Acta Phys. Pol. A 122, 1034 (2012).
14. Y. Liu, H.-J. Jin, C.-B. Park, G.C. Hoang, Trans. Electric. Electron. Mater. 10, 24 (2009).
15. J. Moulder, W.F. Stickle, P.E. Sobol, K.D. Bomben, J. Chastain, Handbook of X-ray Electron Spec- troscopy, Perkin-Elmer, Minnesota 1992.
16. M. Petravic, P.N.K. Deenapanray, V.A. Coleman, C. Jagadish, K.-J. Kim, B. Kim, S. Koike, M. Sasa, M. Inoue, M. Yano, Surf. Sci. 600, L81 (2006).
17. J.M. Bian, X.M. Li, X.D. Gao, W.D. Yu, L.D. Chen, Appl. Phys. Lett. 84, 541 (2004).
18. Y.-J. Zeng, Z. Zh. Ye, J.-G. Lu, L.-P. Zhu, D.-Y. Li, B.-H. Zhao, J.-Y. Huang, Appl. Surf. Sci. 249, 203 (2005).
19. N. Tabet, M. Faiz, A. Al-Oteibi, Electron Spectrosc. Relat. Phenom. 163, 15 (2008).
20. M. Chen, X. Wang, Y.H. Yu, Z.L. Pei, X.D. Bai, C. Sun, R.F. Huang, L.S. Wen, Appl. Surf. Sci. 158, 134 (2000).
21. S.-M. Park, T. Ikegami, K. Ebihara, Thin Solid Films 513, 90 (2006).
22. L. Li, L. Fang, X.J. Zhou, Z.Y. Liu, L. Zhao, Sh. Jiang, Electron Spectrosc. Relat. Phenom. 173, 7 (2009).