Chemical states of nitrogen in ZnO studied by near-edge X-ray absorption fine structure and core-level photoemission spectroscopies

Surface Science

Volumn 600, Issue 7, 2006, Pages

  Petravic, M ^a   Deenapanray, P N K ^a   Coleman, V A ^a   Jagadish, C ^a   Kim, K J ^b   Kim, B ^b   Koike, K ^c   Sasa, S ^c   Inoue, M ^c   Yano, M ^c  

^a AUSTRALIAN NATIONAL UNIVERSITY   (Australia)

^b Pohang University of Science and Technology (POSTECH)   (South Korea)

^c OSAKA INSTITUTE OF TECHNOLOGY   (Japan)

Author keywords

NEXAFS; Nitrogen ions; Photoemission spectroscopy; ZnO

Indexed keywords

ION BOMBARDMENT; IONS; STRUCTURE (COMPOSITION); X RAY PHOTOELECTRON SPECTROSCOPY; ZINC OXIDE;

NEXAFS; NITROGEN IONS; PHOTOEMISSION SPECTROSCOPY;

NITROGEN;

EID: 33645152942     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.susc.2006.01.015     Document Type: Article

References (26)

1. D.C. Look Mater. Sci. Eng. B 80 2001 383
2. D.C. Look, and B. Claflin Phys. Stat. Sol. B 241 2004 624
3. For a recent review on ZnO, see, for example S.J. Pearton, D.P. Norton, K. Ip, Y.W. Heo, and T. Steiner J. Vac. Sci. Technol. 22 2004 932
4. A. Kobayashi, O.F. Sankey, and J.D. Dow Phys. Rev. B 28 1983 946
5. E.-C. Lee, Y.-S. Kim, Y.-G. Jin, and K.J. Chang Phys. Rev. B 64 2001 085120
6. M. Joseph, H. Tabata, and T. Kawai Jpn. J. Appl. Phys. 38 1999 L1205
7. L.G. Wang, and A. Zunger Phys. Rev. Lett. 90 2003 256401
8. Y. Yan, S.B. Zhang, and S.T. Pantelides Phys. Rev. Lett. 86 2001 5723
9. Z.Q. Chen, T. Sekiguchi, X.L. Yuan, M. Maekawa, and A. Kawasuso J. Phys.: Condens. Matter 6 2004 S293
10. Ya.I. Alivov, D.C. Look, B.M. Ataev, M.V. Chukichev, V.V. Mamedov, V.I. Zinenko, Yu.A. Agafonov, and A.N. Pustovit Solid State Electron. 48 2004 2343
11. C.-C. Lin, S.-Y. Chen, S.-Y. Cheng, and H.-Y. Lee Appl. Phys. Lett. 84 2004 5040
12. E. Sonder, R.A. Zuhr, and R.E. Valiga J. Appl. Phys. 64 1988 1140
13. M. Petravic, P.N.K. Deenapanray, V.A. Coleman, K.-J. Kim, B. Kim, and G. Li J. Appl. Phys. 95 2004 5487
14. J. Stöhr NEXAFS Spectroscopy 1996 Springer-Verlag Berlin
15. F. Esaka, H. Shimada, M. Imamura, N. Matsubayashi, T. Sato, A. Nishijima, A. Kawana, H. Ichimura, T. Kikutchi, and K. Furuya Thin Solid Films 281-282 1996 314
16. J.-D. Hecht, F. Frost, D. Hirsch, H. Neumann, A. Schindler, A.B. Preobrajenski, and T. Chassé J. Appl. Phys. 90 2001 6066
17. M. Petravic, Q. Gao, D. Macdonald, D. Llewellyn, C. Crotti, unpublished.
18. J.G. Chen Surf. Sci. Reports 30 1997 1
19. W.H.E. Schwarz, T.C. Chang, and J.P. Connerade Chem. Phys. Lett. 49 1977 207
20. G.R. Wight, and C.E. Brion J. Electron Spectrosc. Relat. Phenom. 3 1974 191
21. G.R. Wight, and C.E. Brion J. Electron Spectrosc. Relat. Phenom. 4 1974 313
22. M. Futsuhara, K. Yoshioka, and O. Takai Thin Solid Films 317 1998 322
23. S. Krishnamurty, M. Montalty, M.G. Wardle, M.J. Shaw, P.R. Briddon, K. Svensson, M.R.C. Hunt, and L. Siller Phys. Rev. B 70 2004 045414
24. C.L. Perkins, S.-H. Lee, X. Li, S.E. Asher, and T.J. Coutts J. Appl. Phys. 97 2005 034907
25. Y.-H. Lai, C.-T. Yeh, J.-M. Hwang, H.-L. Hwang, C.-T. Chen, and W.-H. Hung J. Phys. Chem. B 105 2001 10029
26. C.A. Figueroa, A.S. Ferlauto, and F. Avarez J. Appl. Phys. 94 2003 5435