Composite molecular assemblies: Nanoscale structural control and spectroelectrochemical diversity

Journal of the American Chemical Society

Volumn 135, Issue 44, 2013, Pages 16533-16544

  De Ruiter, Graham ^a   Lahav, Michal ^a   Evmenenko, Guennadi ^b,c   Dutta, Pulak ^b   Cristaldi, Domenico A ^d   Gulino, Antonino ^d   Van Der Boom, Milko E ^a  

^a WEIZMANN INSTITUTE OF SCIENCE   (Israel)

^b NORTHWESTERN UNIVERSITY   (United States)

^c Northwestern University   (United States)

^d UNIVERSITY OF CATANIA   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

ANGLE RESOLVED X RAY PHOTOELECTRON SPECTROSCOPY; CONTROLLED DEPOSITION; INTERNAL INTERFACES; RUTHENIUM POLYPYRIDYL COMPLEXES; SEQUENTIAL DEPOSITION; SPECTROELECTROCHEMICAL; SPECTROELECTROCHEMICAL PROPERTIES; SUCCESSIVE DEPOSITIONS;

DEPOSITION; FUNCTIONAL MATERIALS; METAL COMPLEXES; OSMIUM; PHOTOELECTRONS; RUTHENIUM; RUTHENIUM COMPOUNDS; SPECTROSCOPIC ELLIPSOMETRY; STRUCTURAL DYNAMICS; ULTRAVIOLET VISIBLE SPECTROSCOPY;

SPECTROELECTROCHEMISTRY;

MOLECULAR LAYER; NANOCOMPOSITE; OSMIUM; PALLADIUM; PYRIDINE DERIVATIVE; RUTHENIUM COMPLEX;

ARTICLE; CHEMICAL STRUCTURE; ELECTROCHEMICAL ANALYSIS; ELECTRON TRANSPORT; ELLIPSOMETRY; MATERIAL STATE; MOLECULAR DYNAMICS; MOLECULAR INTERACTION; NANOANALYSIS; OXIDATION REDUCTION REACTION; SELF PROPAGATING MOLECULAR ASSEMBLY; SEQUENCE DEPENDENT ASSEMBLY; SPECTROELECTROCHEMISTRY; SYNCHROTRON; SYNCHROTRON X RAY REFLECTIVITY; ULTRAVIOLET SPECTROSCOPY; X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 84887660311     PISSN: 00027863     EISSN: 15205126     Source Type: Journal    
DOI: 10.1021/ja407659z     Document Type: Article

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