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Volumn 115, Issue 14, 2001, Pages 6722-6727

Specular x-ray reflectivity study of ordering in self-assembled organic and hybrid organic-inorganic electro-optic multilayer films

(6) Evmenenko, G a Van Der Boom, M E a Kmetko, J a Dugan, S W a Marks, T J a Dutta, P a

a NORTHWESTERN UNIVERSITY (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CARRIER CONCENTRATION; CHEMISORPTION; CHROMOPHORES; CRYSTAL MICROSTRUCTURE; ELECTROOPTICAL MATERIALS; INTERFACES (MATERIALS); LIGHT REFLECTION; MULTILAYERS; PHYSICAL CHEMISTRY; RADIATION DAMAGE; REFRACTIVE INDEX; SELF ASSEMBLY; SILICONES; SUBSTRATES; SURFACE ROUGHNESS; X RAY ANALYSIS;

ELECTROOPTIC MULTILAYER FILMS; X-RAY REFLECTIVITY (XRR);

SUPERLATTICES;

EID: 0035828648 PISSN: 00219606 EISSN: None Source Type: Journal
DOI: 10.1063/1.1398576 Document Type: Article

Times cited : (42)

References (42)

1
- 0003519909
- Academic, San Diego
- (1991) An Introduction to Ultrathin Organic Films: Front Langmuir - Blodgett to Self-Assembly
- Ulman, A.¹

2
- 0345979435
- (1996) Chem. Rev. , vol.96 , pp. 1533
- Ulman, A.¹

3
- 0029830949
- (1996) J. Am. Chem. Soc. , vol.118 , pp. 8034
- Lin, W.¹ Lin, W.² Wong, G.K.³ Marks, T.J.⁴

4
- 33748578862
- (1995) Angew. Chem. Int. Ed. Engl. , vol.34 , pp. 155
- Marks, T.J.¹ Ratner, M.²

5
- 0000070099
- (1996) Acc. Chem. Res. , vol.29 , pp. 197
- Yitzchaik, S.¹ Marks, T.J.²

6
- 0000594811
- (1994) J. Am. Chem. Soc. , vol.116 , pp. 6636
- Katz, H.E.¹ Wilson, W.L.² Scheller, G.³

7
- 0000237070
- (1997) Anal. Chem. , vol.69 , pp. 240
- Hanken, D.G.¹ Naujok, R.R.² Gray, J.M.³ Corn, R.M.⁴

8
- 0033803137
- (2000) Mater Chem. , vol.12 , pp. 2363
- Neff, G.A.¹ Helfrich, M.R.² Clifton, M.C.³ Page, C.J.⁴

9
- 0034705979
- (2000) J. Am. Chem. Soc. , vol.122 , pp. 7976
- Flory, W.C.¹ Mehrens, S.M.² Blanchard, G.J.³

10
- 0040622243
- (2001) Appl. Phys. Lett. , vol.79 , pp. 587
- Zhao, Y.-G.¹ Wu, A.² Lu, H.-L.³ Chang, S.⁴ Lu, W.-K.⁵ Ho, S.-T.⁶ Van der Boom, M.E.⁷ Marks, T.J.⁸

11
- 0004340784
- in press
- Polym. Prepr. (Am. Chem. Soc., Div. Polym. Chem.)
- Van der Boom, M.E.¹ Malinsky, J.E.² Zhao, Y.-G.³ Chang, S.⁴ Lu, W.-K.⁵ Ho, S.-T.⁶ Marks, T.J.⁷

12
- 0000561340
- (1997) Appl. Phys. Lett. , vol.70 , pp. 1941
- Lunquist, P.M.¹ Lin, W.² Zhou, H.³ Hahn, D.N.⁴ Yitzchaik, S.⁵ Marks, T.J.⁶ Wong, G.K.⁷

13
- 0033905558
- (2000) IEEE J. Sel. Top. Quantum Electron. , vol.6 , pp. 69
- Wooten, E.L.¹ Kissa, K.M.² Yi-Yan, A.³

14
- 33845283073
- (1987) Langmuir , vol.3 , pp. 1034
- Moaz, R.¹ Sagiv, J.²

15
- 0035115308
- (2001) Chem. Mater. , vol.13 , pp. 15
- Van der Boom, M.E.¹ Richter, A.G.² Malinsky, J.E.³ Lee, P.A.⁴ Armstrong, N.R.⁵ Dutta, P.⁶ Marks, T.J.⁷

16
- 0004351298
- in press
- Adv. Funct. Mater.
- Van der Boom, M.E.¹ Evmenenko, G.² Dutta, P.³ Marks, T.J.⁴

17
- 0003717125
- (Butterworth-Heinemann, Boston)
- (1995) Characterization of Organic Thin Films
- Ulman, A.¹

18
- 0003463992
- Springer, Berlin
- (1999) X-Ray and Neutron Reflectivity: Principles and Applications
- Daillant, J.¹ Gibaud, A.²

19
- 0003469715
- X-ray scattering front soft-matter thin films: Materials science and basic research
- Springer, Berlin
- (1999) Springer Tracts in Modern Physics , vol.148
- Tolan, M.¹

20
- 0026122963
- (1991) Langmuir , vol.7 , pp. 437
- Samant, M.G.¹ Brown, C.A.² Gordon II, J.G.³

21
- 46549096636
- (1985) Thin Solid Films , vol.132 , pp. 153
- Pomerantz, M.¹ Segmüller, A.² Netzer, L.³ Sagiv, J.⁴

22
- 33749127816
- (1989) J. Am. Chem. Soc. , vol.111 , pp. 5852
- Wasserman, S.R.¹ Whitesides, G.M.² Tidswell, I.M.³ Ocko, B.M.⁴ Pershan, P.S.⁵ Axe, J.D.⁶

23
- 35949009089
- (1990) Phys. Rev. B , vol.41 , pp. 1111
- Tidswell, I.M.¹ Ocko, B.M.² Pershan, P.S.³ Wasserman, S.R.⁴ Whitesides, G.M.⁵ Axe, J.D.⁶

24
- 36449009715
- (1991) J. Chem. Phys. , vol.95 , pp. 2854
- Tidswell, I.M.¹ Rabedeau, T.A.² Pershan, P.S.³ Kosowsky, S.D.⁴ Folkers, G.P.⁵ Whitesides, G.M.⁶

25
- 0028422072
- (1994) Langmuir , vol.10 , pp. 1171
- Geer, R.E.¹ Stenger, D.A.² Chen, M.S.³ Calvert, J.M.⁴ Shashidhar, R.⁵

26
- 0028765755
- (1994) J. Am. Chem. Soc. , vol.116 , pp. 9158
- Zeppenfeld, A.C.¹ Fiddler, S.L.² Ham, W.K.³ Klopfenstein, B.J.⁴ Page, C.J.⁵

27
- 0000798230
- (1996) Langmuir , vol.12 , pp. 4218
- Roscoe, S.B.¹ Kakkar, A.K.² Marks, T.J.³ Malik, A.⁴ Durbin, M.K.⁵ Lin, W.⁶ Wong, J.K.⁷ Dutta, P.⁸

28
- 0031559364
- (1997) J. Chem. Phys. , vol.107 , pp. 645
- Malik, A.¹ Lin, W.² Durbin, M.K.³ Marks, T.J.⁴ Dutta, P.⁵

29
- 0001758206
- (2000) Polym. Mater. Sci. Eng. , vol.83 , pp. 160
- Van der Boom, M.E.¹ Richter, A.G.² Malinsky, J.E.³ Dutta, P.⁴ Marks, T.J.⁵ Lee, P.A.⁶ Armstrong, N.R.⁷

30
- 0030933799
- (1997) J. Am. Chem. Soc. , vol.119 , pp. 2205
- Lin, W.¹ Lee, T.-L.² Lyman, P.F.³ Lee, J.⁴ Bedzyk, M.J.⁵ Marks, T.J.⁶

31
- 0031269461
- (1997) Langmuir , vol.13 , pp. 6480
- Huang, Z.¹ Wang, P.-C.² MacDiarmid, A.G.³ Xia, Y.⁴ Whitesides, G.⁵

32
- 0034272715
- (2000) Langmuir , vol.16 , pp. 7268
- Fadeev, A.Y.¹ McCarthy, T.J.²

33
- 0003450469
- Plenum, New York
- (1991) Silane Coupling Agents
- Plueddemann, E.P.¹

34
- 84956251753
- (1931) Ann. Phys. (Leipzig) , vol.10 , pp. 769
- Kiessig, H.¹

35
- 26144449160
- (1954) Phys. Rev. , vol.95 , pp. 359
- Parratt, L.G.¹

36
- 3643083247
- (1986) Physica A , vol.140 A , pp. 376
- Als-Nielsen, J.¹

37
- 0002843014
- note

38
- 84904180956
- Atom scattering amplitudes are tabulated
- (1995) J. Phys. Chem. Ref. Data , vol.24 , pp. 71
- Chantler, C.T.¹

39
- 0002876061
- note

40
- 0002727360
- note

41
- 0000426541
- (1960) J. Appl. Phys. , vol.31 , pp. 1331
- Wainfan, N.¹ Parratt, L.G.²

42
- 0032583501
- (1998) J. Am. Chem. Soc. , vol.120 , pp. 13469
- Hatzor, A.¹ Moav, T.² Cohen, H.³ Matlis, S.⁴ Libman, J.⁵ Vaskevich, A.⁶ Shanzer, A.⁷ Rubinstein, I.⁸

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