Microscopy and Microanalysis of Individual Collected Particles

Aerosol Measurement: Principles, Techniques, and Applications: Third Edition

Volumn , Issue , 2011, Pages 179-232

  Fletcher, Robert A ^a   Ritchie, Nicholas W M ^a   Anderson, Ian M ^a   Small, John A ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

Laser microprobe mass spectrometry and instrumentation; Microscopy and microanalysis of individual collected particles; Particle electron beam analysis ultrafine particle analysis, by analytical electron microscopy

Indexed keywords

EID: 84887348102     PISSN: None     EISSN: None     Source Type: Book    
DOI: 10.1002/9781118001684.ch10     Document Type: Chapter

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