Spectrum Simulation in DTSA-II

Microscopy and Microanalysis

Volumn 15, Issue 5, 2009, Pages 454-468

  Ritchie, Nicholas W m ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

EDS; electron; EPMA; Monte Carlo; simulation; X ray

Indexed keywords

EID: 85011531648     PISSN: 14319276     EISSN: 14358115     Source Type: Journal    
DOI: 10.1017/S1431927609990407     Document Type: Article

References (27)

1. Acosta E., Llovet X. & Salvat F. (2002). Monte Carlo simulation of bremsstrahlung emission by electrons. Appl Phys Lett 80, 3228–3230.
2. Alvisi M., Blome M., Griepentrog M., Hodoroaba V.D., Karduck P., Mostert M., Nacucchi M., Procop M., Rohde M., Scholze F., Statham P., Terborg R. & Thiot J.F. (2006). The determination of the efficiency of energy dispersive X-ray spectrometers by a new reference material. Microsc Microanal 12, 406–415.
3. Bastin G., Dijkstra J. & Heijligers H. (1998). PROZA96: An improved matrix correction program for electron probe microanalysis, based on a double Gaussian approach. X-Ray Spectr 27, 3–10.
4. Bote D. & Salvat F. (2008). Calculations of inner-shell ionization by electron impact with the distorted-wave and plane-wave Born approximations. Phys Rev A 77, 042701.
5. Casnati E., Tartari A. & Baraldi C. J. (1982). An empirical-approach to K-shell ionization cross-section by electrons. Phys B: At Mol Opt Phys 15, 155–167.
6. Chantler C.T., Olsen K., Dragoset R.A., Chang J., Kishore A.R., Kotochigova S.A. & Zucker D.S. (2005). X-Ray Form Factor, Attenuation and Scattering Tables (version 2.1). Gaithersburg, MD: National Institute of Standards and Technology. Available at http://physics.nist.gov/ffast (accessed August 15, 2008). Originally published as Chantler, C.T. (2000). J Phys Chem Ref Data 29(4), 597–1048; and Chantler, C.T. (1995). J Phys Chem Ref Data 24, 71–643.
7. Cullen D.E. (1992). Program RELAX: A code designed to calculate X-ray and electron emission spectra as singly charged atoms relax back to neutrality. UCRL-ID-110438, Lawrence Livermore National Laboratory.
8. Czyzewski Z., MacCallum D.O., Romig A. & Joy D.C. (1990). Calculations of Mott scattering cross-section. J Appl Phys 68, 3066–3072.
9. Edgerton R., Fiori C., Hunt J., Isaacson M., Kirkland E. & Zaluzec N. (1991). EMMFF V. 1.0. Available at http://www.amc.anl.gov/ANLSoftwareLibrary/EMMPDL(old)/Info/emmff.doc.
10. Fiori C., Swyt-Thomas C. & Myklebust R. (2005). Desktop spectrum analyzer. Available at http://www.cstl.nist.gov/div837/Division/outputs/DTSA/DTSA.htm.
11. Goldstein J., Newbury D., Joy D., Lyman C., Echlin P., Lifshin E., Sawyer L. & Michael J. (2003). Scanning Electron Microscopy and X-Ray Microanalysis—Third Edition. New York: Kluwer Academic/Plenum Publishers.
12. Heinrich K.J.F. (1986). Mass absorption coefficients for electron probe microanalysis. Proceedings of the 11th International Congress on X-ray Optics and Microanalysis, University of Western Ontario, pp. 67–119.
13. Henke B., Gullikson E. & Davis J. (1993). X-ray interactions: Photoabsorption, scattering, transmission, and reflection at E = 50–30000 eV, Z = 1–92. At Nucl Data 54, 181–342.
14. Jablonski A., Salvat F. & Powell C.J. (2003). NIST Electron Elastic-Scattering Cross-Section Database—Version 3.1. Gaithersburg, MD: National Institute of Standards and Technology.
15. Joy D.C. & Luo S. (1989). An empirical stopping power relationship for low-energy electons. Scanning 11, 176–180.
16. Kissel L., Quarles C. & Pratt R. (1983). Shape functions for atomic-field bremsstrahlung from electrons of kinetic energy 1–500 keV on selected neutral atoms 1 ≤ Z ≤ 92. Atom Data Nucl Data 28, 381–460.
17. Knoll G. (2000). Radiation Detection and Measurement—Third Edition. New York: John Wiley and Sons.
18. Myklebust R., Newbury D. & Yakowitz H. (1976). In NBS Special Publication 460, Heinrich K., Yakowitz H. & Newbury D. (Eds.), p. 105. Washington, DC: National Bureau of Standards.
19. Niculae A., Soltau H., Lutz G., Lechner P., Bechteler A., Eckhardt R., Hermenau K., Jaritschin O., Liebel A., Simsek A., Jaritschin O., Liebel A., Simsek A., Schaller G., Schopper F., Strüder L., Schaller G., Schopper F. & Strüder L. (2008). Expanding the detector efficiency of silicon drift detectors with optimized radiation entrance window. Proceedings of 57th Annual Conference on Applications of X-Ray Analysis, Denver, Colorado, August 4–8, 2008.
20. Pouchou J.-L. & Pichoir F. (1991). Quantitative analysis of homogeneous or stratified microvolumes applying the model ‘PAP.’ In Electron Probe Quantification, Heinrich K. & Newbury D. (Eds.), pp. 31–75. New York: Plenum.
21. Press W., Teukolsky S., Vetterling W. & Flannery B. (1992). Numerical Recipes in C—The Art of Scientific Computing—Second Edition. New York: Cambridge University Press.
22. Ritchie N.W.M. (2005). A new Monte Carlo application for complex sample geometries. Surf Interface Anal 37, 1006–1011.
23. Salvat F., Fernández-Varea J.M. & Sempau J. (2006). PENELOPE-2006 computer code. OECD/NEA Data Bank, Issy-les-Moulineaux, France. Available at http://www.nea.fr/lists/penelope.html.
24. Scott V., Love G. & Reed S. (1995). Quantitative Electron-Probe Microanalysis—Second Edition. New York: Ellis Horwood.
25. Seltzer S. & Berger M. (1986). Bremsstrahlung energy-spectra from electrons with kinetic-energy 1 keV–10 GeV incident on screened nuclei and orbital electrons of neutral atoms with Z = 1–100. Atom Data Nucl Data 35, 345–418.
26. Small J., Newbury D. & Myklebust R. (1987). Modeling of the bremsstrahlung radiation produced in pure-element targets by 10–40 keV electrons. J Appl Phys 61(2), 459–469.
27. Villarrubia J.S., Ritchie N.W.M. & Lowney J.R. (2007). Monte Carlo modeling of secondary electron imaging in three dimensions. Proc SPIE 6518, 65180K 1–14.