Atomic force microscopy (AFM), transmission electron microscopy (TEM) and scanning electron microscopy (SEM) of nanoscale plate-shaped second phase particles

Philosophical Magazine

Volumn 87, Issue 17, 2007, Pages 2427-2460

  Sobchenko, I ^a,b   Pesicka, J ^a,c   Baither, D ^a   Stracke, W ^a   Pretorius, T ^a,d   Chi, L ^a   Reichelt, R ^a   Nembach, E ^a  

^a UNIVERSITY OF MÜNSTER   (Germany)

^b CHERKASY NATIONAL UNIVERSITY   (Ukraine)

^c CHARLES UNIVERSITY   (Czech Republic)

^d BIAS BREMER INSTITUT FÜR ANGEWANDTE STRAHLTECHNIK GMBH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; DATA REDUCTION; NICKEL ALLOYS; NUMERICAL METHODS; PARTICLE SIZE ANALYSIS; SCANNING ELECTRON MICROSCOPY; TRANSMISSION ELECTRON MICROSCOPY;

PHASE PARTICLES; SUPERELLIPSOIDS;

NANOSTRUCTURED MATERIALS;

EID: 34249078608     PISSN: 14786435     EISSN: 14786443     Source Type: Journal    
DOI: 10.1080/14786430701203184     Document Type: Article

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