Application of atomic force microscopy to particle sizing

Fresenius' Journal of Analytical Chemistry

Volumn 363, Issue 4, 1999, Pages 323-332

  Kollensperger G ^a   Friedbacher, G ^a   Krammer, A ^a   Grasserbauer, M ^a  

^a VIENNA UNIVERSITY OF TECHNOLOGY   (Austria)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 4244018754     PISSN: 09370633     EISSN: None     Source Type: Journal    
DOI: 10.1007/s002160051198     Document Type: Article

References (22)

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