The use of time-of-flight static secondary ion mass spectrometry imaging for the molecular characterization of single aerosol surfaces

Analytica Chimica Acta

Volumn 558, Issue 1-2, 2006, Pages 115-124

  Van Ham, Rita ^a   Adriaens, Annemie ^b   Van Vaeck, Luc ^a   Adams, Freddy ^a  

^a UNIVERSITY OF ANTWERP   (Belgium)

^b GHENT UNIVERSITY   (Belgium)

Author keywords

Aerosols; Imaging; Speciation; Surface analysis; TOF S SIMS

Indexed keywords

AERODYNAMICS; AEROSOLS; COMPOSITION; IMAGING TECHNIQUES; MOLECULAR DYNAMICS; PARTICLES (PARTICULATE MATTER); SALTS; SURFACE CHEMISTRY;

MOLECULAR CHARACTERIZATION; SPECIATION; SURFACE ANALYSIS; TOF S-SIMS;

SECONDARY ION MASS SPECTROMETRY;

CALCIUM CARBONATE; INORGANIC SALT; NITRIC ACID; SILICON; SULFURIC ACID;

AEROSOL; ARTICLE; CHEMICAL REACTION; CHEMICAL STRUCTURE; FLOW RATE; IMAGE ANALYSIS; ION MONITORING; IRRADIATION; PARTICLE SIZE; PRIORITY JOURNAL; SIGNAL DETECTION; SURFACE PROPERTY; TIME OF FLIGHT MASS SPECTROMETRY;

EID: 31044433353     PISSN: 00032670     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.aca.2005.11.041     Document Type: Article

References (45)

1. Y. Mamane, R. Willis, and T. Conner Aerosol Sci. Technol. 34 2001 97
2. P.H. McMurry Atmos. Environ. 34 2000 1959
3. J. Watt Water Air Soil Pollut. 106 1998 309
4. I. Orlic Nucl. Instrum. Meth. B 104 1995 602
5. K.G. Malmqvist Nucl. Instrum. Meth. B 85 1994 84
6. Y.-J. Zhu, N. Olson, and T.P. Beeben Jr. Environ. Sci. Technol. 35 2001 3113
7. W. Jambers, L. De Bock, and R. Van Grieken Analyst 120 1995 681
8. M. Dangler, S. Burke, S.V. Hering, and D.T. Allen Atmos. Environ. 21 1987 1001
9. R. Kaufmann, P. Wieser, and R. Wurster Scann. Electron. Microscopy II 1980 607
10. E. Denoyer, R. Van Grieken, F. Adams, and D.F.S. Natusch Anal. Chem. 54 1982 26A
11. F. Bruynseels, H. Storms, H. Tavares, and R. Van Grieken Int. J. Environ. Anal. Chem. 23 1985 1
12. I. Dierck, D. Michaud, L. Wouters, and R. Van Grieken Environ. Sci. Technol. 26 1992 802
13. A. Hachimi, E. Poitevin, G. Krier, J.F. Muller, J. Pironon, and F. Klein Analysis 21 1993 77
14. D.T. Suess, and K.A. Prather Chem. Rev. 99 1999 3007
15. C.A. Noble, and K.A. Prather Mass Spectrom. Rev. 19 2000 248
16. R.L. Holm, M.E. Gälli, M.R. Palmer, F.R. Quant, and G.J. Sem J. Aerosol Sci. 31 2000 S398
17. E. Gard, J.E. Mayer, B.D. Morrical, T. Dienes, D.P. Fergenson, and K.A. Prather Anal. Chem. 69 1997 4083
18. C.A. Noble, and K.A. Prather Environ. Sci. Technol. 30 1996 2667
19. A. Wexler, and K.A. Prather Aerosol Sci. Technol. 33 2000 1
20. A.L. van Wuijckhuijse, M.A. Stowers, C.E. Kientz, J.C.M. Marijnissen, and B. Scarlett J. Aerosol Sci. 31 2000 S1013
21. L. Van Vaeck, A. Adriaens, and R. Gijbels Mass Spectrom. Rev. 18 1999 1
22. A. Adriaens, L. Van Vaeck, and F. Adams Mass Spectrom. Rev. 18 1999 48
23. J.C. Vickerman, and D. Briggs TOF-SIMS: Surface Analysis by Mass Spectrometry 2001 IM Publications Chichester, UK 778 pp
24. J.S. Becker, and H.-J. Dietze Int. J. Mass Spectrom. 197 2000 1
25. F. Schröder-Oeynhausen, B. Burkhardt, T. Fladung, F. Kotter, A. Schnieders, L. Wiedmann, and A. Benninghoven J. Vac. Sci. Technol. B 16 1998 1002
26. G.S. Groenewold, A.D. Appelhans, G.L. Gresham, J.C. Ingram, and A.D. Shaw Int. J. Mass Spectrom. 178 1/2 1998 19
27. E. Cuynen, L. Van Vaeck, and P. Van Espen Rapid Commun. Mass Spectrom. 13 1999 2287
28. M.J. Van Stipdonk, V. Santiago, E.A. Schweikert, C.C. Chusuei, and D.W. Goodman Int. J. Mass Spectrom. 197 2000 149
29. M.J. Van Stipdonk, D.R. Justes, C.M. Force, and E.A. Schweikert Anal. Chem. 72 11 2000 2468
30. K. Hirokawa, Z. Li, and A. Tanaka Fresnius J. Anal. Chem. 370 2001 348
31. Z. Li, and K. Hirokawa Appl. Surf. Sci. 220 2003 136
32. R. Van Ham, L. Van Vaeck, F. Adams, and A. Adriaens J. Anal. Atom. Spectrom. 20 2005 1088
33. R. Van Ham, L. Van Vaeck, A. Adriaens, F. Adams, B. Hodges, A. Appelhans, G. Groenewold, Int. J. Mass Spectrom. 247 (2005) 28.
34. R. Van Ham, L. Van Vaeck, F. Adams, and A. Adriaens Anal. Chem. 79 6 2004 2609
35. J. Lenaerts, G. Verlinden, L. Van Vaeck, R. Gijbels, I. Geuens, and P. Callant Langmuir 17 2001 7332
36. Y.-J. Zhu, N. Olson, and T.P. Beebe Jr. Environ. Sci. Technol. 35 2001 3113
37. J. Zehnpfenning, H.G. Cramer, T. Heller, E. Niehuis, H. Rulle, T. Stephan, and A. Benninghoven A. Benninghoven Y. Nihei R. Shimizu H.W. Werner Proceedings of the Ninth International Conference on Secondary Ion Mass Spectrometry (SIMS IX) 1993 John Wiley Chichester 453
38. K.D. Childs, D. Narum, L.A. LaVanier, P.M. Lindley, B.W. Schueler, G. Mulholland, and A.C. Diebold J. Vac. Sci. Technol. A 14 1996 2392
39. P.K. Chu, R.W. Odom, and D.F. Reich Mater. Chem. Phys. 43 1996 87
40. M. Pósfai, X. Huifang, J.R. Anderson, and P.R. Buseck Geophys. Res. Lett. 25 1998 1907
41. S.T. Martin Phase transitions of aqueous atmospheric particles Chem. Rev. 100 2000 3403 3453
42. J.T. Kiehl, B.P. Briegleb, Science 260 (1993) 311.
43. B.J. Kruegera, V.H. Grassiana, J.P. Cowinb, and A. Laskinb Atmos. Environ. 38 2004 6253 6261
44. C.J. Ottley, and R.M. Harrison Atmos. Environ. 26A 1992 1689
45. C.-U. Ro, K.-Y. Oh, J. Osan, J. de Hoog, A. Worobiec, and R. Van Grieken Anal. Chem. 73 2001 4574