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Applied Physics Letters

Volumn 103, Issue 17, 2013, Pages

Degradation mechanisms in GaN light-emitting diodes undergoing reverse-bias operations in water vapor

(3) Chen, Hsiang a Yun Huang, Bo a Cheng Chu, Yu a

a NATIONAL CHI NAN UNIVERSITY (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

DEGRADATION MECHANISM; DEVICE PERFORMANCE; ELECTRICAL CHARACTERIZATION; ENERGY DISPERSIVE X RAY SPECTROSCOPY; GAN LIGHT-EMITTING DIODES; HIGH ELECTRIC FIELDS; ION BEAM DEPOSITION; OPTICAL MEASUREMENT;

DEGRADATION; ELECTRIC FIELDS; GALLIUM NITRIDE; OPTICAL DATA PROCESSING; SCANNING ELECTRON MICROSCOPY; WATER VAPOR; X RAY SPECTROSCOPY;

LIGHT EMITTING DIODES;

EID: 84887098662 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.4826254 Document Type: Article

Times cited : (12)

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